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A review of hydrodynamic and energy-transport models for semiconductor device simulation
T Grasser, TW Tang, H Kosina… - Proceedings of the …, 2003 - ieeexplore.ieee.org
Since Stratton published his famous paper four decades ago, various transport models have
been proposed which account for the average carrier energy or temperature in one way or …
been proposed which account for the average carrier energy or temperature in one way or …
[KNYGA][B] Computational Electronics: semiclassical and quantum device modeling and simulation
Starting with the simplest semiclassical approaches and ending with the description of
complex fully quantum-mechanical methods for quantum transport analysis of state-of-the …
complex fully quantum-mechanical methods for quantum transport analysis of state-of-the …
Modeling of tunneling current and gate dielectric reliability for nonvolatile memory devices
A Gehring, S Selberherr - IEEE Transactions on Device and …, 2004 - ieeexplore.ieee.org
We present a hierarchy of tunneling models suitable for the two-and three-dimensional
simulation of logic and nonvolatile semiconductor memory devices. The crucial modeling …
simulation of logic and nonvolatile semiconductor memory devices. The crucial modeling …
Normalization indicator of ion-induced radiation damage in power VDMOS transistors
F Liu, Z Liu, X **, S Liu, L Wu, J Yang… - … on Nuclear Science, 2024 - ieeexplore.ieee.org
This work presents the impact of heavy ion irradiation on vertical-diffused metal-oxide-
semiconductor field-effect transistors (VDMOSFETs), particularly focusing on the ionization …
semiconductor field-effect transistors (VDMOSFETs), particularly focusing on the ionization …
Hydrodynamic simulation of semiconductor devices
AW Smith, KF Brennan - Progress in quantum electronics, 1997 - Elsevier
In this paper, we present an introduction to hydrodynamic-based simulation of
semiconductor devices. A very general approach is given to illustrate a mathematical …
semiconductor devices. A very general approach is given to illustrate a mathematical …
Modeling of hot-carrier degradation in nLDMOS devices: different approaches to the solution of the Boltzmann transport equation
We propose two different approaches to describe carrier transport in n-laterally diffused
MOS (nLDMOS) transistor and use the calculated carrier energy distribution as an input for …
MOS (nLDMOS) transistor and use the calculated carrier energy distribution as an input for …
Studies on the Effect of Dust–Ion Collision on Dust–Ion Acoustic Solitary Waves in a Magnetized Dusty Plasma in the Framework of Damped KP Equation and …
A Roy, S Raut, R Barman - Plasma Physics Reports, 2022 - Springer
The influence of the dust–ion collision effect on the propagation of ion–acoustic waves
(IAWs) in a collisional magnetized dusty plasma containing positive ions, dust grains with a …
(IAWs) in a collisional magnetized dusty plasma containing positive ions, dust grains with a …
Simple and efficient modeling of EPROM writing
C Fiegna, F Venturi, M Melanotte… - IEEE transactions on …, 2002 - ieeexplore.ieee.org
A simple and efficient model for first-order simulation of the writing of n-channel erasable
programmable ROM (EPROM) cells is presented. It allows the current injected into the gate …
programmable ROM (EPROM) cells is presented. It allows the current injected into the gate …
Characterization of the hot electron distribution function using six moments
The shape of the hot electron distribution function in semiconductor devices is insufficiently
described using only the first four moments. We propose using six moments of the …
described using only the first four moments. We propose using six moments of the …
Complete transient simulation of Flash EEPROM devices
S Keeney, R Bez, D Cantarelli… - IEEE transactions on …, 1992 - ieeexplore.ieee.org
A two-dimensional device simulator which allows the complete transient simulation of
nonvolatile memories is presented. The simulator has been derived from HFIELDS and …
nonvolatile memories is presented. The simulator has been derived from HFIELDS and …