A review of hydrodynamic and energy-transport models for semiconductor device simulation

T Grasser, TW Tang, H Kosina… - Proceedings of the …, 2003 - ieeexplore.ieee.org
Since Stratton published his famous paper four decades ago, various transport models have
been proposed which account for the average carrier energy or temperature in one way or …

[KNYGA][B] Computational Electronics: semiclassical and quantum device modeling and simulation

D Vasileska, SM Goodnick, G Klimeck - 2017 - books.google.com
Starting with the simplest semiclassical approaches and ending with the description of
complex fully quantum-mechanical methods for quantum transport analysis of state-of-the …

Modeling of tunneling current and gate dielectric reliability for nonvolatile memory devices

A Gehring, S Selberherr - IEEE Transactions on Device and …, 2004 - ieeexplore.ieee.org
We present a hierarchy of tunneling models suitable for the two-and three-dimensional
simulation of logic and nonvolatile semiconductor memory devices. The crucial modeling …

Normalization indicator of ion-induced radiation damage in power VDMOS transistors

F Liu, Z Liu, X **, S Liu, L Wu, J Yang… - … on Nuclear Science, 2024 - ieeexplore.ieee.org
This work presents the impact of heavy ion irradiation on vertical-diffused metal-oxide-
semiconductor field-effect transistors (VDMOSFETs), particularly focusing on the ionization …

Hydrodynamic simulation of semiconductor devices

AW Smith, KF Brennan - Progress in quantum electronics, 1997 - Elsevier
In this paper, we present an introduction to hydrodynamic-based simulation of
semiconductor devices. A very general approach is given to illustrate a mathematical …

Modeling of hot-carrier degradation in nLDMOS devices: different approaches to the solution of the Boltzmann transport equation

P Sharma, S Tyaginov, Y Wimmer… - … on Electron Devices, 2015 - ieeexplore.ieee.org
We propose two different approaches to describe carrier transport in n-laterally diffused
MOS (nLDMOS) transistor and use the calculated carrier energy distribution as an input for …

Studies on the Effect of Dust–Ion Collision on Dust–Ion Acoustic Solitary Waves in a Magnetized Dusty Plasma in the Framework of Damped KP Equation and …

A Roy, S Raut, R Barman - Plasma Physics Reports, 2022 - Springer
The influence of the dust–ion collision effect on the propagation of ion–acoustic waves
(IAWs) in a collisional magnetized dusty plasma containing positive ions, dust grains with a …

Simple and efficient modeling of EPROM writing

C Fiegna, F Venturi, M Melanotte… - IEEE transactions on …, 2002 - ieeexplore.ieee.org
A simple and efficient model for first-order simulation of the writing of n-channel erasable
programmable ROM (EPROM) cells is presented. It allows the current injected into the gate …

Characterization of the hot electron distribution function using six moments

T Grasser, H Kosina, C Heitzinger… - Journal of applied …, 2002 - pubs.aip.org
The shape of the hot electron distribution function in semiconductor devices is insufficiently
described using only the first four moments. We propose using six moments of the …

Complete transient simulation of Flash EEPROM devices

S Keeney, R Bez, D Cantarelli… - IEEE transactions on …, 1992 - ieeexplore.ieee.org
A two-dimensional device simulator which allows the complete transient simulation of
nonvolatile memories is presented. The simulator has been derived from HFIELDS and …