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Cu@ Sn core–shell structure powder preform for high-temperature applications based on transient liquid phase bonding
H Chen, T Hu, M Li, Z Zhao - IEEE Transactions on Power …, 2016 - ieeexplore.ieee.org
This paper presents a novel die-attach material for high-temperature applications based on
transient liquid phase (TLP) bonding. Cu particles are electroless plated with Sn to achieve …
transient liquid phase (TLP) bonding. Cu particles are electroless plated with Sn to achieve …
[HTML][HTML] Microstructural and mechanical characteristics of Cu-Sn intermetallic compound interconnects formed by TLPB with Cu-Sn nanocomposite
H Jiang, S Robertson, S Liang, Z Zhou, L Zhao… - Materials Today …, 2022 - Elsevier
Transient liquid phase bonding (TLPB) is a promising technology for three-dimensional
integration of circuits (3D IC), but it can be slow and less productive. A novel Cu-Sn …
integration of circuits (3D IC), but it can be slow and less productive. A novel Cu-Sn …
Understanding of void formation in Cu/Sn-Sn/Cu system during transient liquid phase bonding process through diffusion modeling
S Bordère, E Feuillet, JL Diot, R De Langlade… - … Materials Transactions B, 2018 - Springer
Abstract Transient Liquid Phase (TPL) bounding of Sn foil sandwiched between two Cu foils
involves, in the temperature range above the melting point of Sn (232° C) and below 350° C …
involves, in the temperature range above the melting point of Sn (232° C) and below 350° C …
Microstructure evolution, grain morphology variation and mechanical property change of Cu-Sn intermetallic joints subjected to high-temperature aging
J Liu, H Zhao, Z Li, X Song, Y Zhao, H Niu, H Tian… - Materials …, 2018 - Elsevier
In this work, the aging treatment was carried out on full Cu 3 Sn joints at different
temperatures for various durations, the microstructure evolution, grain morphology variation …
temperatures for various durations, the microstructure evolution, grain morphology variation …
Improved Cu/Sn interface reliability using double-layer stacked nano-twinned Cu
Z Chen, P Chen, Y Sun, T Hang, H Su, K Lou… - Materials …, 2023 - Elsevier
The immoderate growth of intermetallic compound (IMC) at the Cu/Sn bonding interface
reduces the reliability of bonding joints, leading to the failure of high-density packaging …
reduces the reliability of bonding joints, leading to the failure of high-density packaging …
Study of electroless Sn-coated Cu microparticles and their application as a high temperature thermal interface material
T Hu, H Chen, C Wang, M Huang, F Zhao - Surface and Coatings …, 2017 - Elsevier
A series of Cusingle bondSn reactions were studied for the electroless plating of Sn onto Cu
microparticles. The Cu microparticles were more temperature-sensitive than the planar Cu …
microparticles. The Cu microparticles were more temperature-sensitive than the planar Cu …
Low-Resistance Interconnects by Bonding Porous Cu Bumps and Ultrathin Cu/Sn Pads
Z Wang, W Zhao, Z Wang - IEEE Transactions on Electron …, 2025 - ieeexplore.ieee.org
CuSn–Cu bonding is widely used in 2.5-D integration due to the ease of operation.
However, it suffers from high bond resistance due to the high resistivity of Cu–Sn …
However, it suffers from high bond resistance due to the high resistivity of Cu–Sn …
Fabrication of highly reliable joint based on Cu/Ni/Sn double-layer powder for high temperature application
H Xu, Y Shen, Y Hu, J Li, J Xu - … of Microelectronics and …, 2019 - meridian.allenpress.com
A highly reliable three-dimensional network structure joint was fabricated based on Cu/Ni/Sn
powder with double-layer coatings and transient liquid phase bonding (TLPB) technology for …
powder with double-layer coatings and transient liquid phase bonding (TLPB) technology for …
Research on Ni3Sn4 intermetallic compound for 5μm diameter Cu/Ni/Sn-3.0 Ag micro bumps
Abstract for 5 µm diameter micro bumps, the interfacial intermetallic compounds (IMCs)
seriously affects the interconnection performance of micro bumps. In this paper, we focused …
seriously affects the interconnection performance of micro bumps. In this paper, we focused …
Tribological Behavior of Electrical Connector Sn/Ni/Cu Coating with Intermetallic Compound Layers Under Reciprocating Motion
N Tyrer, GC Barber, F Yang, B Pang… - Advanced …, 2022 - Wiley Online Library
Electroplating is one of the most common methods for applying electronic connector
coatings. This research investigated the tribological behavior of electroplated multilayer …
coatings. This research investigated the tribological behavior of electroplated multilayer …