As the size of materials, particles, and devices shrinks to nanometer, atomic, or even
quantum scale, it is more challenging to characterize their thermal properties reliably …

A novel combined setup, with a scanning thermal microscope (SThM) embedded in a
scanning electron microscope (SEM), is used to characterize a suspended silicon rough …

Thermal conductivity measurements using Scanning Thermal Microscopy (SThM) usually
involve heat transfer across the mechanical contact and liquid meniscus between the …

We characterize heat dissipation of supported molybdenum disulfide (MoS 2) monolayers
grown by chemical vapor deposition by means of ambient-condition scanning thermal …

We propose an approach for the characterization of scanning thermal microscopy (SThM)
probe response using a sample with silicon dioxide steps. The chessboard-like sample …

Scanning thermal microscopy (SThM) is the only method for thermal measurements
providing spatial resolution in the nanometer range. The method combines the …

Irradiating porous silicon is expected to reduce thermal conductivity without altering the
porous structure and can be studied by optical techniques provided that optical properties …

Electron beam lithography (EBL) on non-planar, suspended, curved or bent surfaces is still
one of the most frequently stated problems for fabricating novel and innovative nano-devices …

Scanning thermal microscopy allows thermal characterization with nanoscale resolution.
However, quantitative usage has been met with skepticism, because no standard exists for …

Understanding how thermal-phonon paths can be shaped is key for controlling heat
dissipation at the nanoscale. Thermophononic crystals are periodic porous nanostructures …