Perspective: Ga2O3 for ultra-high power rectifiers and MOSFETS

SJ Pearton, F Ren, M Tadjer, J Kim - Journal of Applied Physics, 2018 - pubs.aip.org
Gallium oxide (Ga2O3) is emerging as a viable candidate for certain classes of power
electronics with capabilities beyond existing technologies due to its large bandgap …

High breakdown voltage quasi-two-dimensional β-Ga2O3 field-effect transistors with a boron nitride field plate

J Bae, HW Kim, IH Kang, G Yang, J Kim - Applied Physics Letters, 2018 - pubs.aip.org
We have demonstrated a β-Ga 2 O 3 metal-semiconductor field-effect transistor (MESFET)
with a high off-state breakdown voltage (344 V), based on a quasi-two-dimensional β-Ga 2 …

[HTML][HTML] Optimization AlGaN/GaN HEMT with field plate structures

N Shi, K Wang, B Zhou, J Weng, Z Cheng - Micromachines, 2022 - mdpi.com
AlGaN/GaN HEMTs with several different designs of field plate structure are studied for
device optimization purposes. To increase device breakdown voltage, optimal dimensions of …

Reliability improvements in AlGaN/GaN Schottky barrier diodes with a gated edge termination

E Acurio, F Crupi, N Ronchi… - … on Electron Devices, 2018 - ieeexplore.ieee.org
This paper focuses on the time-dependent breakdown of the AlGaN/GaN Schottky barrier
diodes with a gated edge termination (GET) submitted to high-voltage stress. The impact of …

Impact of n-GaN cap layer do** on the gate leakage behavior in AlGaN/GaN HEMTs grown on Si and GaN substrates

J Kotani, J Yaita, A Yamada, N Nakamura… - Journal of Applied …, 2020 - pubs.aip.org
The gate leakage characteristics of n-GaN-and i-GaN-capped AlGaN/GaN high-electron-
mobility transistor (HEMT) heterostructures grown on various substrates of Si, SiC, and GaN …

Investigation of SiNx and AlN Passivation for AlGaN/GaN High-Electron-Mobility Transistors: Role of Interface Traps and Polarization Charges

S Yang, Z Tang, M Hua, Z Zhang, J Wei… - IEEE Journal of the …, 2020 - ieeexplore.ieee.org
In this work, we studied the mechanisms and switching properties of AlGaN/GaN high-
electron-mobility-transistors (HEMTs) passivated by amorphous-SiN x and monocrystal-like …

Study on the heat transfer of GaN-based high power HEMTs

L Yang, Z Chen, X Xu, J Zhang - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
In this paper, study on the heat transfer of GaN-based high electron mobility transistors
(HEMTs) on SiC substrate was carried out utilizing transient thermal analysis method. Gate …

Impact of gate sidewall angle on the electrical characteristics of V-shaped gate III-nitride HEMTs: An investigation into self-heating and geometrical effects

Z Kurd, Z Ahangari, MJ Mohammad Zamani… - Journal of …, 2021 - Springer
Variation of gate sidewall angle in V-shaped gate HEMTs impacts the device electrical
performance, including self-heating effects, high-frequency operation and the breakdown …

Analysis of AlGaN/GaN-Based HEMT with 3-Step Gate Field Plate for High Power Applications

S Kumar, H Ranjan, SK Dubey, S Nandi… - … of Electron Devices …, 2024 - ieeexplore.ieee.org
The proposed research work investigated a 3-step gate field plated heterojunction FET or
high electron mobility transistor (HEMT) based on AIGaN/GaN material system. The …

[PDF][PDF] Noise modeling and simulation of DCDMG AlGaN/GaN MODFET

RK Yadav, P Pathak, RM Mehra - International Journal of Applied …, 2017 - researchgate.net
This article presents analytical noise equivalent circuit model for analysis and
characterization of novel field plated dual channel dual material gate (DCDMG) AlGaN/GaN …