Electronics and packaging intended for emerging harsh environment applications: A review

A Hassan, Y Savaria, M Sawan - IEEE transactions on very …, 2018 - ieeexplore.ieee.org
Several industrial applications require specific electronic systems installed in harsh
environments to perform measurements, monitoring, and control tasks such as in space …

An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools

Q Huang, J Jiang - Progress in Nuclear Energy, 2019 - Elsevier
New requirements on post-accident monitoring systems in nuclear power plants pose fresh
challenges for electronic system designers and nuclear power plant personnel, in particular …

Radiation effects in a post-Moore world

DM Fleetwood - IEEE Transactions on Nuclear Science, 2021 - ieeexplore.ieee.org
An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

Radiation effects in SiGe technology

JD Cressler - IEEE transactions on Nuclear Science, 2013 - ieeexplore.ieee.org
Silicon-Germanium (SiGe) technology effectively merges the desirable attributes of
conventional silicon-based CMOS manufacturing (high integration levels, at high yield and …

Silicon-germanium as an enabling technology for extreme environment electronics

JD Cressler - IEEE transactions on device and materials …, 2010 - ieeexplore.ieee.org
“Extreme environment” electronics represent an important niche market in the trillion dollar
global electronics industry and span the operation of electronic circuits and systems in …

Impact of Bias Conditions on Total Ionizing Dose Effects of in SiGe HBT

J Zhang, Q Guo, H Guo, W Lu, C He… - … on Nuclear Science, 2016 - ieeexplore.ieee.org
The effect of bias condition on total ionizing dose (TID) of Silicon–Germanium heterojunction
bipolar transistors (SiGe HBTs) is investigated. The SiGe HBTs are set at forward, saturated …

Simulation and analysis of inverse-mode operation of single event transient mechanisms on NPN-SiGe HBT

MA Adekoya, S Liu, X Wang, T **ng, H Li… - Physica …, 2024 - iopscience.iop.org
This work presents the characteristics of the single event transient (SET) induced by a single
heavy ion in the inverse mode NPN-SiGe HBT simulated with the Silvaco TCAD toolkit. The …

Voltage-controlled oscillator utilizing inverse-mode SiGe-HBT biasing circuit for the mitigation of single-event effects

PKC Mishu, MK Cho, A Khachatrian… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
The advantages and the tradeoffs associated with the use of inverse-mode (IM) silicon–
germanium (SiGe) heterojunction bipolar transistors (HBTs) biasing circuitry in radio …

Evaluation of enhanced low dose rate sensitivity in fourth-generation SiGe HBTs

ZE Fleetwood, AS Cardoso, I Song… - IEEE transactions on …, 2014 - ieeexplore.ieee.org
The total ionizing dose response of 4th-generation SiGe HBTs is assessed at both low and
high dose rates to evaluate enhanced low dose rate sensitivity (ELDRS) in a new SiGe …

Single-event transient and total dose response of precision voltage reference circuits designed in a 90-nm SiGe BiCMOS technology

AS Cardoso, PS Chakraborty… - IEEE transactions on …, 2014 - ieeexplore.ieee.org
This paper presents an investigation of the impact of single-event transients (SETs) and total
ionization dose (TID) on precision voltage reference circuits designed in a fourth-generation …