Key role of very low energy electrons in tin-based molecular resists for extreme ultraviolet nanolithography

I Bespalov, Y Zhang, J Haitjema… - … applied materials & …, 2020 - ACS Publications
Extreme ultraviolet (EUV) lithography (13.5 nm) is the newest technology that allows high-
throughput fabrication of electronic circuitry in the sub-20 nm scale. It is commonly assumed …

Mean free path of electrons in organic photoresists for extreme ultraviolet lithography in the kinetic energy range 20–450 eV

R Fallica, N Mahne, T Conard… - … Applied Materials & …, 2023 - ACS Publications
The blur caused by the nonzero mean free path of electrons in photoresists exposed by
extreme ultraviolet lithography has detrimental consequences on patterning resolution, but …

Chemical modification mechanisms in hybrid hafnium oxo-methacrylate nanocluster photoresists for extreme ultraviolet patterning

EC Mattson, Y Cabrera, SM Rupich, Y Wang… - Chemistry of …, 2018 - ACS Publications
The potential implementation of extreme ultraviolet (EUV) lithography into next generation
device processing is bringing urgency to identify resist materials that optimize EUV …

Energy Dissipation of Fast Electrons in Polymethylmethacrylate: Toward a Universal Curve for Electron-Beam Attenuation in Solids between and Relativistic …

WSM Werner, F Simperl, F Blödorn, J Brunner, J Kero… - Physical Review Letters, 2024 - APS
Spectroscopy of correlated electron pairs was employed to investigate the energy
dissipation process, as well as the transport and the emission of low-energy electrons on a …

EUV lithography process challenges

E Buitrago, TS Kulmala, R Fallica, Y Ekinci - Frontiers of Nanoscience, 2016 - Elsevier
Outstanding technology innovations have continuously allowed photolithography to remain
at the forefront of semiconductor manufacturing for decades. New materials and processes …

Acid generation efficiency of EUV PAGs via low energy electron exposure

S Grzeskowiak, A Narasimhan, E Rebeyev… - Journal of …, 2016 - jstage.jst.go.jp
Optimizing the photochemistry of extreme ultraviolet (EUV) photoresists can lead to faster,
more efficient resists needed for implementation of EUV lithography into high volume …

Studying electron-PAG interactions using electron-induced fluorescence

A Narasimhan, S Grzeskowiak… - Advances in …, 2016 - spiedigitallibrary.org
In extreme ultraviolet (EUV) lithography, 92 eV photons are used to expose photoresists.
Typical EUV resists are organic-based and chemically amplified using photoacid generators …

Analytical techniques for mechanistic characterization of EUV photoresists

S Grzeskowiak, A Narasimhan… - Advances in …, 2017 - spiedigitallibrary.org
Extreme ultraviolet (EUV,~ 13.5 nm) lithography is the prospective technology for high
volume manufacturing by the microelectronics industry. Significant strides towards achieving …

Indium nitrate hydrate films as EUV resists by evaluating with 92-eV electron beam

J Grayson, M Valdez, W Xu… - Advances in Patterning …, 2023 - spiedigitallibrary.org
Indium nitrate hydrate films are evaluated as potential extreme ultraviolet (EUV) resists. The
uniformity and stability of indium nitrate-based sol-gel precursor films are studied as a …

Cross sections of photoacid generators at low electron energies

S Grzeskowiak, A Narasimhan, J Ostrander… - Journal of Vacuum …, 2015 - pubs.aip.org
Optimizing the photochemistry in extreme ultraviolet (EUV) photoresists due to EUV
exposures may enable faster, more efficient resists, leading to a greater throughput in …