Deformations of single-crystal silicon circular plate: Theory and experiment

S Lychev, A Digilov, G Demin, E Gusev, I Kushnarev… - Symmetry, 2024 - mdpi.com
In this paper, the experimental methodology for the single-crystal circular plate deformation
measurement and subsequent procedure for the quantitation of its mechanical properties …

Enhancement of 6.7 nm EUV emission from laser-produced Gd plasma with micro-structured target

Q Zhang, Y Dou, Y Zhang, Z Wen, C Wang, F Ye… - Vacuum, 2024 - Elsevier
We present the experimental investigations of extreme ultraviolet (EUV) radiation of laser-
produced plasma based on the micro-structured Gd target and obtain a strong EUV radiation …

[HTML][HTML] Surface Degradation of Thin-Layer Al/MgF2 Mirrors under Exposure to Powerful VUV Radiation

A Skriabin, V Telekh, A Pavlov, D Pasynkova… - Nanomaterials, 2023 - mdpi.com
Thin-layer Al/MgF2 coatings are currently used for extraterrestrial far-UV astronomy as the
primary and secondary mirrors of telescopes (such as “Spektr-UF”). Successful Hubble far …

Monitoring the temperature of a Mo/Si mirror with photoluminescence in extreme-ultraviolet lithography

JI Lo, YC Peng, HC Lu, TR Tseng… - ACS Applied Electronic …, 2022 - ACS Publications
Extreme-ultraviolet lithography uses a Mo/Si multilayer mirror as an optical unit to produce
nanochips in a semiconductor fabrication plant. The Mo/Si multilayer mirror radiates an …

Effect of low nitrogen concentration on reactive RF sputtering of boron

M Li, X Wen, H Hu, P Wu, OV Penkov - Vacuum, 2024 - Elsevier
Monolayer boron and B/Mo/B/Mo coatings were prepared by reactive magnetron sputtering
in the N 2/Ar atmosphere with different RF powers, and the effect of the N 2: Ar flow ratio was …

Carbon/boron multilayer for beyond EUV lithography

U Fujimoto, T Harada, S Yamakawa… - … Japan 2023: XXIX …, 2023 - spiedigitallibrary.org
In 2019, EUV lithography technology with a wavelength of 13.5 nm was first applied to mass
production of 7 nm+ node logic devices. In the future, since semiconductor devices with …

An efficient method for the experimental characterization of periodic multilayer mirrors: A global optimization approach

M Li, S Mikki, PC Uzoma… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
This study proposes a new approach to periodic multilayer mirrors (PMMs) characterizations
based on measured X-ray reflectivity (XRR) data. Here, XRR data are used to reconstruct …

Nested sampling aided determination of tantalum optical constants in the EUV spectral range

Q Saadeh, P Naujok, M Wu, V Philipsen, D Thakare… - Applied Optics, 2022 - opg.optica.org
<? TeX-2pc-0pc?> We report on determining the optical constants of Ta in the sub-extreme
ultraviolet (EUV) spectral range 5.0–24.0 nm from the angle-dependent reflectance (ADR) …

Cavity-based compact light source for extreme ultraviolet lithography

C He, H Yang, N Huang, B Liu, H Deng - arxiv preprint arxiv:2501.14541, 2025 - arxiv.org
A critical technology for high-volume manufacturing of nanoscale integrated circuits is a high-
power extreme ultraviolet (EUV) light source. Over the past decades, laser-produced plasma …

Performance characterization of an Al2O3/HfO2 parabolic multilayer based on a laboratory X-ray source

T Yuan, Y Li, T Sun, X Sun, G Niu, J Hu, L Hua… - Applied Optics, 2024 - opg.optica.org
Parabolic multilayers (PMs) are widely used in synchrotron radiation, X-ray free electron
lasers, laboratory X-ray sources, and so on, and therefore, how to expediently and effectively …