Electromigration and the structure of metallic nanocontacts

R Hoffmann-Vogel - Applied Physics Reviews, 2017 - pubs.aip.org
This article reviews efforts to structurally characterize metallic nanocontacts. While the
electronic characterization of such junctions is relatively straight forward, usually it is …

Microstructure, tensile and electrical properties of gold-coated silver bonding wire

YW Tseng, FY Hung, TS Lui - Microelectronics Reliability, 2015 - Elsevier
Au-coated Ag wire offers an oxidation-resistant layer and added benefits compared with
pure Ag wires. It can remain unchanged without any deterioration for long storage periods …

Linearly Polarized Electroluminescence from MoS2 Monolayers Deposited on Metal Nanoparticles: Toward Tunable Room‐Temperature Single‐Photon Sources

RP Puchert, FJ Hofmann, HS Angerer, J Vogelsang… - Small, 2021 - Wiley Online Library
Break junctions in noble‐metal films can exhibit electroluminescence (EL) through inelastic
electron tunneling. The EL spectrum can be tuned by depositing a single‐layer crystal of a …

Anisotropy of electromigration-induced void and island drift

A Latz, SP Sindermann, L Brendel… - Journal of Physics …, 2013 - iopscience.iop.org
By means of our novel self-learning kinetic Monte Carlo model (Latz et al 2012 J. Phys.:
Condens. Matter 24 485005) we study the electromigration-induced drift of monolayer voids …

Lattice degradation by moving voids during reversible electromigration

SP Sindermann, A Latz, D Spoddig… - Journal of Applied …, 2014 - pubs.aip.org
Electromigration driven void motion is studied in Ag wires with an initially well-defined single
crystal lattice by in situ scanning electron microscopy. Voids are moving in opposite direction …