Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond
C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …
and spectroscopy of materials down to atomic resolution. Recent advances in detector …
py4DSTEM: A software package for four-dimensional scanning transmission electron microscopy data analysis
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and
spectroscopy of materials on length scales ranging from microns to atoms. By using a high …
spectroscopy of materials on length scales ranging from microns to atoms. By using a high …
Polar and quasicrystal vortex observed in twisted-bilayer molybdenum disulfide
We report the observation of an electric field in twisted-bilayer molybdenum disulfide (MoS2)
and elucidate its correlation with local polar domains using four-dimensional scanning …
and elucidate its correlation with local polar domains using four-dimensional scanning …
Probing charge density in materials with atomic resolution in real space
The charge distribution in materials at the nanoscale can often explain the origin of
macroscopic properties such as localized conductivity or the plasmonic response and …
macroscopic properties such as localized conductivity or the plasmonic response and …
Review of recent progress on in situ TEM shear deformation: a retrospective and perspective view
Advances in the use of in situ transmission electron microscopy (TEM) to study mechanical
deformation have enabled a direct correlation of mechanical properties with microstructures …
deformation have enabled a direct correlation of mechanical properties with microstructures …
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications
D Jannis, C Hofer, C Gao, X ** Nanoscale Electrostatic Field Fluctuations around Graphene Dislocation Cores Using Four-Dimensional Scanning Transmission Electron Microscopy (4D …
Defects in crystalline lattices cause modulation of the atomic density, and this leads to
variations in the associated electrostatics at the nanoscale. Map** these spatially varying …
variations in the associated electrostatics at the nanoscale. Map** these spatially varying …
Imaging the electron charge density in monolayer MoS2 at the Ångstrom scale
Four-dimensional scanning transmission electron microscopy (4D-STEM) has recently
gained widespread attention for its ability to image atomic electric fields with sub-Ångstrom …
gained widespread attention for its ability to image atomic electric fields with sub-Ångstrom …
Map** 1D Confined Electromagnetic Edge States in 2D Monolayer Semiconducting MoS2 Using 4D-STEM
Four-dimensional (4D) scanning transmission electron microscopy is used to study the
electric fields at the edges of 2D semiconducting monolayer MoS2. Sub-nanometer 1D …
electric fields at the edges of 2D semiconducting monolayer MoS2. Sub-nanometer 1D …