Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and
spectroscopy of materials on length scales ranging from microns to atoms. By using a high …

A fast, robust pipeline for strain map** of crystalline materials is important for many
technological applications. Scanning electron nanodiffraction allows us to calculate strain …

Strain analysis by nano-beam electron diffraction allows for measurements of strain with
nanometre resolution in a large field of view. This is done by evaluating distances between …

We introduce an image-contrast mechanism for scanning transmission electron microscopy
(STEM) that derives from the local symmetry within the specimen. For a given position of the …

Abstract 4D-scanning transmission electron microscopy (4D-STEM) can be used to measure
electric fields such as atomic fields or polarization-induced electric fields in crystal …

The transmission electron microscope (TEM) is a powerful imaging, diffraction and
spectroscopy tool that has revolutionized the field of microscopy. It has contributed to …

The measurement of electric fields in scanning transmission electron microscopy (STEM) is
a highly investigated field of research. The constant improvement of spatial resolution in …

Achieving nanoscale strain fields map** in intricate van der Waals (vdW) nanostructures,
like twisted flakes and nanorods, presents several challenges due to their complex …