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X-canceling MISR—An X-tolerant methodology for compacting output responses with unknowns using a MISR
A new X-tolerant multiple-input signature register (MISR) compaction methodology is
proposed which can compact output streams containing unknown (X) values. Unlike …
proposed which can compact output streams containing unknown (X) values. Unlike …
Xlbist: X-tolerant logic bist
P Wohl, JA Waicukauski, GA Maston… - … IEEE International Test …, 2018 - ieeexplore.ieee.org
Logic Built-In Self-Test (LBIST) is becoming a requirement for high-complexity, high-
reliability ICs which are increasingly used in the automotive field. Traditionally, LBIST can …
reliability ICs which are increasingly used in the automotive field. Traditionally, LBIST can …
FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects
Small delay faults may be an indicator of a reliability threat, even if they do not affect the
system functionality yet. In recent years, Faster-than-at-Speed-Test (FAST) has become a …
system functionality yet. In recent years, Faster-than-at-Speed-Test (FAST) has become a …
Predicting -Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach
Digital circuits are often prone to suffer from uncertain timing, inadequate sensor feedback,
limited controllability of past states or inability of initializing memory-banks, and erroneous …
limited controllability of past states or inability of initializing memory-banks, and erroneous …
BIST power reduction using scan-chain disable in the Cell processor
Built-in self test is a major part of the manufacturing test procedure for the cell processor.
However, pseudo random patterns cause a high switching activity which is not effectively …
However, pseudo random patterns cause a high switching activity which is not effectively …
Response compaction with any number of unknowns using a new LFSR architecture
This paper presents a new test response compaction technique with any number of
unknown logic values (X's) in the test response bits. The technique leverages an X-tolerant …
unknown logic values (X's) in the test response bits. The technique leverages an X-tolerant …
Deterministic stellar BIST for automotive ICs
As the automotive industry enters a period of rapid evolution changing the way cars are
designed and produced, the number of complex safety-critical components deployed in …
designed and produced, the number of complex safety-critical components deployed in …
Information-theoretic and statistical methods of failure log selection for improved diagnosis
Diagnosis of each failed part requires the failed data captured on the test equipment.
However, due to memory limitations on the tester, one often cannot store all the failed data …
However, due to memory limitations on the tester, one often cannot store all the failed data …
X-press compactor for 1000x reduction of test data
The paper presents a two-stage test response compactor with an overdrive section and scan
chain selection logic. The proposed solution is capable of handling a wide range of X state …
chain selection logic. The proposed solution is capable of handling a wide range of X state …
X-Press: two-stage X-tolerant compactor with programmable selector
This paper presents X-Press-a new two-stage test-response compactor that can be easily
integrated with a multiple scan-chain environment. This compactor preserves all benefits of …
integrated with a multiple scan-chain environment. This compactor preserves all benefits of …