Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Prototype of Hi'Beam-SEE: A Real-time High-resolution Single Event Effects Locating Device for Heavy Ion Facilities
J Liao, Y Jia, S Liao, J Du, H Yang… - … on Nuclear Science, 2025 - ieeexplore.ieee.org
Integrated circuits (ICs) are widely used in spacecraft and are concerned with the probability
of Single Event Effects (SEEs). To accurately locate the SEE-sensitive area of ICs, we have …
of Single Event Effects (SEEs). To accurately locate the SEE-sensitive area of ICs, we have …