3-D integration and through-silicon vias in MEMS and microsensors

Z Wang - Journal of Microelectromechanical Systems, 2015 - ieeexplore.ieee.org
After two decades of intensive development, 3-D integration has proven invaluable for
allowing integrated circuits to adhere to Moore's Law without needing to continuously shrink …

Microsystems using three-dimensional integration and TSV technologies: Fundamentals and applications

Z Wang - Microelectronic Engineering, 2019 - Elsevier
As a powerful enabling technology, three-dimensional (3D) integration, which uses wafer
bonding to integrate multiple wafers in the vertical direction and uses through‑silicon-vias …

Wafer-level vacuum sealing by transfer bonding of silicon caps for small footprint and ultra-thin MEMS packages

X Wang, SJ Bleiker, P Edinger… - Journal of …, 2019 - ieeexplore.ieee.org
Vacuum and hermetic packaging is a critical requirement for optimal performance of many
micro-electromechanical systems (MEMS), vacuum electronics, and quantum devices …

Hermetic chip-scale packaging using Au: Sn eutectic bonding for implantable devices

KM Szostak, M Keshavarz… - … of Micromechanics and …, 2021 - iopscience.iop.org
Advancements in miniaturisation and new capabilities of implantable devices impose a
need for the development of compact, hermetic, and CMOS-compatible micro packaging …

A study on the thermomechanical reliability risks of through-silicon-vias in sensor applications

S Shao, D Liu, Y Niu, K O'Donnell, D Sengupta, S Park - Sensors, 2017 - mdpi.com
Reliability risks for two different types of through-silicon-vias (TSVs) are discussed in this
paper. The first is a partially-filled copper TSV, if which the copper layer covers the side walls …

Fabrication and characterization of gold-tin eutectic bonding for hermetic packaging of MEMS devices

EC Demir, MM Torunbalci, I Donmez… - 2014 IEEE 16th …, 2014 - ieeexplore.ieee.org
This paper presents the fabrication of wafer-level hermetic encapsulation for MEMS devices
using low-temperature (300° C) Au-Sn bonding together with their pre-and postbonding …

Zero-level packaging for (RF-) MEMS implementing TSVs and metal bonding

NP Pham, V Cherman, B Vandevelde… - 2011 IEEE 61st …, 2011 - ieeexplore.ieee.org
This paper presents a 0-level packaging technology for (RF-) MEMS implementing vertical
feedthroughs or through-Si-via's (TSVs) and metal bonding. A thinned cap** substrate …

Solidification and interfacial interactions in gold–tin system during eutectic or thermo-compression bonding for 200 mm MEMS wafer level hermetic packaging

A Garnier, X Baillin, F Hodaj - Journal of Materials Science: Materials in …, 2013 - Springer
Abstract In this work, Au–Sn eutectic bonding and Au–Sn thermo-compression bonding are
studied for applications in hermetic packaging at wafer level. Eutectic bonding experiments …

Metal‐bonding‐based hermetic wafer‐level MEMS packaging technology using in‐plane feedthrough: Hermeticity and high frequency characteristics of thick gold film …

M Moriyama, Y Suzuki, K Totsu… - … Engineering in Japan, 2019 - Wiley Online Library
Au–Au‐bonding‐based wafer‐level vacuum packaging technology using in‐plane
feedthrough of thick Au signal lines was developed for high‐frequency micro …

Gold-tin bonding for 200mm wafer level hermetic MEMS packaging

A Garnier, E Lagoutte, X Baillin… - 2011 IEEE 61st …, 2011 - ieeexplore.ieee.org
Gold-Tin eutectic bonding was studied to get hermetic packaging at wafer level. Scanning
Electron Microscopy cross section images showed the sealing joint morphology at different …