Atomic layer deposition of gallium oxide films as gate dielectrics in AlGaN/GaN metal–oxide–semiconductor high-electron-mobility transistors

HY Shih, FC Chu, A Das, CY Lee, MJ Chen… - Nanoscale Research …, 2016 - Springer
In this study, films of gallium oxide (Ga 2 O 3) were prepared through remote plasma atomic
layer deposition (RP-ALD) using triethylgallium and oxygen plasma. The chemical …

Different effects of Mg and Si do** on the thermal transport of gallium nitride

S Li, L Yu, C Qi, K Du, G Qin, Z **ong - Frontiers in Materials, 2021 - frontiersin.org
Mg and Si as the typical dopants for p-and n-type gallium nitride (GaN), respectively, are
widely used in GaN-based photoelectric devices. The thermal transport properties play a key …

Solution-Processed Epitaxial Growth of MAPbI3 Single-Crystal Films for Highly Stable Photodetectors

Y Xu, X Wang, J Zhao, Y Pan, Y Li, EE Elemike… - Frontiers in …, 2021 - frontiersin.org
Recent years, organic-inorganic hybrid perovskites (OIHPs) have been widely used in
applications, such as solar cells, lasers, light-emission diodes, and photodetectors due to …

Effects of ammonia-ambient annealing on physical and electrical characteristics of rare earth CeO2 as passivation film on silicon

HJ Quah, Z Hassan, FK Yam, NM Ahmed… - Journal of Alloys and …, 2017 - Elsevier
Abstract Effects of post-deposition annealing at 400–1000° C in ammonia (NH 3) gas
ambient towards physical and electrical characteristics of metal-organic decomposition …

Passivation of silicon substrate using two-step grown ternary aluminium doped zirconium oxide

HJ Quah, Z Hassan, WF Lim - Applied Surface Science, 2019 - Elsevier
Ternary based aluminium doped zirconium oxide (Al x Zr y O z) was grown on silicon (Si)
substrate after post-sputter oxidation of the Al single bondZr film at different temperatures …

Gallium defects in : A density functional theory study

GR Jenness, MK Shukla, BC Masters - Physical Review B, 2024 - APS
Aluminum is an important component in many consumer goods, such as automobiles. Ore
refinement and the production of end products incurs a significant energy cost. An …

Retardation Mechanism of Ultrathin Al2O3 Interlayer on Y2O3 Passivated Gallium Nitride Surface

HJ Quah, KY Cheong - ACS Applied Materials & Interfaces, 2014 - ACS Publications
A systematic investigation was carried out by incorporating an ultrathin aluminum oxide
(Al2O3) as an interlayer between yttrium oxide (Y2O3) passivation layer and GaN substrate …

A two-step growth route of ternary aluminium doped zirconium oxide film on silicon

HJ Quah, Z Hassan, WF Lim - Journal of Alloys and Compounds, 2019 - Elsevier
Co-sputtering and post-sputter oxidation were incorporated as a two-step growth route for
the formation of ternary aluminium doped zirconium oxide (Al x Zr y O z) films on silicon (Si) …

[HTML][HTML] Structural, morphological, optical, and gas sensing characteristics of ultraviolet-assisted photoelectrochemical etching derived AlInGaN nano-spikes

WF Lim, Z Hassan, HJ Quah - Journal of Materials Research and …, 2019 - Elsevier
The formation of nano-dendritic like structure and nano-spikes in AlInGaN films via
ultraviolet-assisted photoelectrochemical (PEC) etching at different current densities (5, 20 …

Effects of post-deposition annealing time in oxygen ambient on Y2O3 film deposited on silicon substrate

HJ Quah, KY Cheong - Materials Research Innovations, 2014 - Taylor & Francis
In this work, systematic investigation was performed to study the effects of post-deposition
annealing time (15, 30 and 45 minutes) at 1000° C in oxygen ambient on electrical …