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Recent advances in GaN‐based power HEMT devices
The ever‐increasing power density and operation frequency in electrical power conversion
systems require the development of power devices that can outperform conventional Si …
systems require the development of power devices that can outperform conventional Si …
GaN-based power devices: Physics, reliability, and perspectives
Over the last decade, gallium nitride (GaN) has emerged as an excellent material for the
fabrication of power devices. Among the semiconductors for which power devices are …
fabrication of power devices. Among the semiconductors for which power devices are …
Trap-assisted degradation mechanisms in E-mode p-GaN power HEMT: A review
Abstract Transistor-based on Gallium Nitride (GaN) technology, has enabled energy-saving
power electronics to alleviate global energy utilization. Being the initial stages of the …
power electronics to alleviate global energy utilization. Being the initial stages of the …
Dynamic on-State Resistance Test and Evaluation of GaN Power Devices Under Hard- and Soft-Switching Conditions by Double and Multiple Pulses
The dynamic on-state resistance (RDSON) behavior of commercial GaN devices is very
important for a GaN-based converter. Since the zero-voltage switching techniques are …
important for a GaN-based converter. Since the zero-voltage switching techniques are …
An actively-passivated p-GaN gate HEMT with screening effect against surface traps
Y Wu, J Wei, M Wang, M Nuo, J Yang… - IEEE Electron …, 2022 - ieeexplore.ieee.org
An active-passivation p-GaN gate HEMT (AP-HEMT), featuring an active p-GaN passivation
layer extending into the drain-side access region, is demonstrated on a commercial E-mode …
layer extending into the drain-side access region, is demonstrated on a commercial E-mode …
Dynamic on-Resistance in GaN-on-Si HEMTs: Origins, Dependencies, and Future Characterization Frameworks
Gallium nitride high-electron-mobility transistors (GaN HEMTs) exhibit dynamic ON-
resistance (dR on), where the ON-resistance immediately after turn-ON is higher than the dc …
resistance (dR on), where the ON-resistance immediately after turn-ON is higher than the dc …
Investigation of the dynamic on-state resistance of 600 V normally-off and normally-on GaN HEMTs
N Badawi, O Hilt, E Bahat-Treidel… - IEEE Transactions …, 2016 - ieeexplore.ieee.org
In this paper, current collapse phenomena and thermal effects in normally-off and normally-
on GaN HEMTs are investigated. The experimental results show that a high-off-state voltage …
on GaN HEMTs are investigated. The experimental results show that a high-off-state voltage …
Kinetics of Buffer-Related RON-Increase in GaN-on-Silicon MIS-HEMTs
This letter reports an extensive analysis of the charge capture transients induced by OFF-
state bias in double heterostructure AlGaN/GaN MIS-high electron mobility transistor grown …
state bias in double heterostructure AlGaN/GaN MIS-high electron mobility transistor grown …
Trap** mechanisms in GaN‐based MIS‐HEMTs grown on silicon substrate
In this work we report on the three dominant trap** mechanisms affecting the dynamic
performance of a double‐heterostructure GaN‐based MIS‐HEMT grown on silicon …
performance of a double‐heterostructure GaN‐based MIS‐HEMT grown on silicon …
Product-level reliability of GaN devices
SR Bahl, D Ruiz, DS Lee - 2016 IEEE International Reliability …, 2016 - ieeexplore.ieee.org
To enable the widespread adoption of GaN products, the industry needs to be convinced of
product-level reliability. The difficulty with product-level reliability lies with the diverse range …
product-level reliability. The difficulty with product-level reliability lies with the diverse range …