Recent advances in GaN‐based power HEMT devices

J He, WC Cheng, Q Wang, K Cheng… - Advanced electronic …, 2021 - Wiley Online Library
The ever‐increasing power density and operation frequency in electrical power conversion
systems require the development of power devices that can outperform conventional Si …

GaN-based power devices: Physics, reliability, and perspectives

M Meneghini, C De Santi, I Abid, M Buffolo… - Journal of Applied …, 2021 - pubs.aip.org
Over the last decade, gallium nitride (GaN) has emerged as an excellent material for the
fabrication of power devices. Among the semiconductors for which power devices are …

Trap-assisted degradation mechanisms in E-mode p-GaN power HEMT: A review

P Nautiyal, P Pande, VS Kundu… - Microelectronics …, 2022 - Elsevier
Abstract Transistor-based on Gallium Nitride (GaN) technology, has enabled energy-saving
power electronics to alleviate global energy utilization. Being the initial stages of the …

Dynamic on-State Resistance Test and Evaluation of GaN Power Devices Under Hard- and Soft-Switching Conditions by Double and Multiple Pulses

R Li, X Wu, S Yang, K Sheng - IEEE Transactions on Power …, 2018 - ieeexplore.ieee.org
The dynamic on-state resistance (RDSON) behavior of commercial GaN devices is very
important for a GaN-based converter. Since the zero-voltage switching techniques are …

An actively-passivated p-GaN gate HEMT with screening effect against surface traps

Y Wu, J Wei, M Wang, M Nuo, J Yang… - IEEE Electron …, 2022 - ieeexplore.ieee.org
An active-passivation p-GaN gate HEMT (AP-HEMT), featuring an active p-GaN passivation
layer extending into the drain-side access region, is demonstrated on a commercial E-mode …

Dynamic on-Resistance in GaN-on-Si HEMTs: Origins, Dependencies, and Future Characterization Frameworks

G Zulauf, M Guacci, JW Kolar - IEEE Transactions on Power …, 2019 - ieeexplore.ieee.org
Gallium nitride high-electron-mobility transistors (GaN HEMTs) exhibit dynamic ON-
resistance (dR on), where the ON-resistance immediately after turn-ON is higher than the dc …

Investigation of the dynamic on-state resistance of 600 V normally-off and normally-on GaN HEMTs

N Badawi, O Hilt, E Bahat-Treidel… - IEEE Transactions …, 2016 - ieeexplore.ieee.org
In this paper, current collapse phenomena and thermal effects in normally-off and normally-
on GaN HEMTs are investigated. The experimental results show that a high-off-state voltage …

Kinetics of Buffer-Related RON-Increase in GaN-on-Silicon MIS-HEMTs

D Bisi, M Meneghini, FA Marino… - IEEE Electron …, 2014 - ieeexplore.ieee.org
This letter reports an extensive analysis of the charge capture transients induced by OFF-
state bias in double heterostructure AlGaN/GaN MIS-high electron mobility transistor grown …

Trap** mechanisms in GaN‐based MIS‐HEMTs grown on silicon substrate

D Bisi, M Meneghini, M Van Hove… - … status solidi (a), 2015 - Wiley Online Library
In this work we report on the three dominant trap** mechanisms affecting the dynamic
performance of a double‐heterostructure GaN‐based MIS‐HEMT grown on silicon …

Product-level reliability of GaN devices

SR Bahl, D Ruiz, DS Lee - 2016 IEEE International Reliability …, 2016 - ieeexplore.ieee.org
To enable the widespread adoption of GaN products, the industry needs to be convinced of
product-level reliability. The difficulty with product-level reliability lies with the diverse range …