Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been
extended to a wide spectrum of basic and applied fields. Its application to basic science led …

Atomically precise manufacturing (APM) is a key technique that involves the direct control of
atoms in order to manufacture products or components of products. It has been developed …

We present here the historic development of Scanning Tunneling Microscopy (STM);
thephysical and technical aspects have already been covered in a few recent reviews and …

A scanning ion-conductance microscope (SICM) has been developed that can image the
topography of nonconducting surfaces that are covered with electrolytes. The probe of the …

In a Scanning Tunneling Microscope [1], an electronic current flows through the tunneling
barrier be-tween an atomically sharp tip and a conductive surface. Roughly speaking, the …

Presented here is an overview of the present status and future prospects of scanning
tunneling microscopy. Topics covered include the physical basis of the scanning tunneling …

We demonstrate the usefulness and high sensitivity of the atomic force microscope (AFM) for
imaging surface dielectric properties and for potentiometry through the detection of …

The combination of atomic force microscopy and Kelvin probe technology is a powerful tool
to obtain high-resolution maps of the surface potential distribution on conducting and …

Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly
growing field of STM, and its many derivatives. A thorough discussion of the various …

The principle of inertial sliding of a platform on a periodically accelerated support is
exploited for the design of a piezoelectric fine‐positioning device. The device provides step …