High-throughput computational screening of Ti-based binary alloys as diffusion barrier layers for copper interconnects

HD Feng, YT Xu, S Peng, Q Zhao, M Wen… - Materials Today …, 2023 - Elsevier
This study utilized first-principles high-throughput computations to scrutinize the viability of Ti-
W and Ti-Ru binary alloys as diffusion barrier layers for copper interconnects. By computing …

Laser additive manufacturing of bimetallic structure from TC4 to IN718 via Ta/Cu multi-interlayer

C Wang, C Shang, Z Liu, G Xu… - Materials Research …, 2020 - iopscience.iop.org
Titanium alloys and nickel-based alloys have their own unique properties, and the bimetallic
structure composed of the two alloys can be widely used in the aerospace field. However …

Measurement and error analysis of Cu film thickness with Ta barrier layer on wafer for CMP application

Z Qu, W Wang, X Li, Q Li… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Accurate thickness measurement of copper (Cu) film on silicon (Si)-based wafers is very
important in the chemical mechanical polishing (CMP) process. For thickness measurement …

Mechanical properties and diffusion barrier performance of CrWN coatings fabricated through hybrid HiPIMS/RFMS

LC Chang, CE Wu, TY Ou - Coatings, 2021 - mdpi.com
CrWN coatings were fabricated through a hybrid high-power impulse magnetron
sputtering/radio-frequency magnetron sputtering technique. The phase structures …

Effect of Ta/Cu Film Stack Structures on the Interfacial Adhesion Energy for Advanced Interconnects

K Son, S Kim, C Kim, G Kim, YC Joo… - Journal of the …, 2021 - koreascience.kr
The quantitative measurement of interfacial adhesion energy (Gc) of multilayer thin films for
Cu interconnects was investigated using a double cantilever beam (DCB) and 4-point …

AUTOMATED CONTROL OF THE THIN FILMS ELECTRICAL CONDUCTIVITY BY THE EDDY CURRENT METHOD.

M VN, I AV, V SA, Z RR, S LS, V IV… - Eurasian Physical …, 2024 - search.ebscohost.com
The article considers the possibility of using the eddy current method of non-destructive
testing for the problems of measuring the electrical conductivity of thin metal films. As the …

Precipitate strengthening in nanocrystalline Ti/Ta composites

J Li, S Xu, F Tan, Y Liu, Q Fang - Philosophical Magazine Letters, 2021 - Taylor & Francis
Introducing precipitates significantly improves the strength of metallic materials. In the
present study, we elucidate the role of a precipitated Ti phase on the deformation …

Superminiature Eddy Current Probe for Measuring the Electrical Conductivity of Copper Thin Films

AV Ishkov, RA Kunitsyn, VN Malikov - Key Engineering Materials, 2022 - Trans Tech Publ
The article considers the possibility of applying the eddy current method of non-destructive
testing for measuring the electrical conductivity of new material-thin metal films. Copper films …

高温高应变下 Cu/Ta 界面扩散行为的 分子动力学模拟.

张磊洋, 肖雯天, 柳和生… - Electronic Components & …, 2024 - search.ebscohost.com
采用铜互连的三维集成技术是提高微电子器件性能的一种很有前景的方法. 然而,
由于铜易扩散到硅电子器件中, 导致其性能降低甚至失效, 而钽(Ta) 凭借稳定的化学性能常被 …

[인용][C] Автоматизированный контроль проводимости тонких пленок с использованием вихретокового метода

ВН Маликов, АВ Ишков, СА Войнаш, РР Загидуллин… - Eurasian Physical Technical …, 2024