Thermal management and packaging of wide and ultra-wide bandgap power devices: a review and perspective

Y Qin, B Albano, J Spencer, JS Lundh… - Journal of physics D …, 2023 - iopscience.iop.org
Power semiconductor devices are fundamental drivers for advances in power electronics,
the technology for electric energy conversion. Power devices based on wide-bandgap …

GaN: Processing, defects, and devices

SJ Pearton, JC Zolper, RJ Shul, F Ren - Journal of applied physics, 1999 - pubs.aip.org
The role of extended and point defects, and key impurities such as C, O, and H, on the
electrical and optical properties of GaN is reviewed. Recent progress in the development of …

Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N-and Ga-face AlGaN/GaN heterostructures

O Ambacher, J Smart, JR Shealy… - Journal of applied …, 1999 - pubs.aip.org
Carrier concentration profiles of two-dimensional electron gases are investigated in wurtzite,
Ga-face Al x Ga 1− x N/GaN/Al x Ga 1− x N and N-face GaN/Al x Ga 1− x N/GaN …

Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures

O Ambacher, B Foutz, J Smart, JR Shealy… - Journal of applied …, 2000 - pubs.aip.org
Two dimensional electron gases in Al x Ga 1− x N/GaN based heterostructures, suitable for
high electron mobility transistors, are induced by strong polarization effects. The sheet …

Pyroelectric properties ofAl (In) GaN/GaN hetero-and quantum well structures

O Ambacher, J Majewski, C Miskys… - Journal of physics …, 2002 - iopscience.iop.org
The macroscopic nonlinear pyroelectric polarization of wurtzite Al x Ga 1-x N, In x Ga 1-x N
and Al x In 1-x N ternary compounds (large spontaneous polarization and piezoelectric …

III–nitrides: Growth, characterization, and properties

SC Jain, M Willander, J Narayan… - Journal of Applied …, 2000 - pubs.aip.org
During the last few years the developments in the field of III–nitrides have been spectacular.
High quality epitaxial layers can now be grown by MOVPE. Recently good quality epilayers …

Trap** effects and microwave power performance in AlGaN/GaN HEMTs

SC Binari, K Ikossi, JA Roussos… - … on Electron Devices, 2001 - ieeexplore.ieee.org
The dc small-signal, and microwave power output characteristics of AlGaN/GaN HEMTs are
presented. A maximum drain current greater than 1 A/mm and a gate-drain breakdown …

Trap** effects in GaN and SiC microwave FETs

SC Binari, PB Klein, TE Kazior - Proceedings of the IEEE, 2002 - ieeexplore.ieee.org
It is well known that trap** effects can limit the output power performance of microwave
field-effect transistors (FETs). This is particularly true for the wide bandgap devices. In this …

Fabrication and performance of GaN electronic devices

SJ Pearton, F Ren, AP Zhang, KP Lee - Materials Science and Engineering …, 2000 - Elsevier
GaN and related materials (especially AlGaN) have recently attracted a lot of interest for
applications in high power electronics capable of operation at elevated temperatures …

Self-heating in high-power AlGaN-GaN HFETs

R Gaska, A Osinsky, JW Yang… - IEEE Electron Device …, 1998 - ieeexplore.ieee.org
We compare self-heating effects in AlGaN-GaN heterostructure field effect transistors
(HFETs) grown on sapphire and SiC substrates. Heat dissipation strongly affects the device …