Integration of computer-aided design (CAD) information into a defect-review SEM platform...

Representation Learning for Wafer Pattern Recognition in Semiconductor Manufacturing Process

S Song, JG Back - … on artificial intelligence in information and …, 2023 - ieeexplore.ieee.org
The Demand for low-power and high-performance semiconductors has rapidly increased.
To improve the competitiveness of system semiconductor companies, an efficient defect …
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Precise pattern alignment for die-to-database inspection based on the generative adversarial network

Y Nam, S Joo, N Kwak, K Kim… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Alignment between the reference layout (or target pattern) and the corresponding scanning
electron microscope (SEM) image is a crucial task for the die-to-database (D2DB) inspection …
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Acinar-Ductal Metaplasia

I Esposito, L Häberle - Pathology of the Pancreas, 2022 - Springer
Anatomical variations of the pancreas, the pancreatic duct system, and the surrounding
vasculature are not uncommon and of importance as disease causing alterations and during …
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