In the present paper, reported literature data on the grain-size dependence of resistivity of Ni
and Cu are critically evaluated by two conceptually different methods. One is the …

We study the effect of thickness on the structural and magnetic properties of permalloy thin
films, evaporated on glass substrate. The films thicknesses range from 16 to 90 nm. From X …

Abstract Series of Ni thin films have been deposited by thermal evaporation onto glass, Si
(111), Cu, mica and Al 2 O 3 substrates with and without a Cu underlayer. The Ni …

The temperature-dependent resistivity measurements of Ni–Si silicide films with 18–290nm
thicknesses are studied as a function of temperature and film thickness over the temperature …

The Magneto-Optic Kerr Effect (MOKE) technique has been used to investigate the magnetic
properties of Ni thin films, with thickness t ranging from 9 to 163 nm, evaporated onto several …

Magnetic, structural and morphological results are presented on Ni (40nm) thin film
deposited on self assembled polystyrene (PS) nanosphere arrays by molecular beam …

This paper studies the effects of a high magnetic field on the structural evolution and
magnetic properties of nanocrystalline Ni films prepared on quartz substrates by a molecular …

To realize the application of Ni films in magnetic recording media, giant magnetoresistive
sensors and microelectromechanical systems, it is necessary to control and improve the …

The temperature-dependent resistivity measurements of Ag/Ni-Si silicide films with 28–260
nm thicknesses are studied as a function of temperature and film thickness over the …

Magnetic resonance force microscopy (MRFM) is a non-invasive, three-dimensional imaging
technique that employs attonewton-sensitivity cantilevers to mechanically detect the …