Determining the minimum operating voltage (V_min) of chip designs is critical for low power
dissipation and assurance of quality and functional safety during manufacturing tests and in …

Speed binning of system-on-chips (SoCs) using conventional Fmax test requires application
of complex functional test patterns. Functional workload-based speed binning techniques …

This paper presents a model-fitting framework to correlate the on-chip measured ring-
oscillator counts to the chip's maximum operating speed. This learned model can be …

Built-In Speed Grading (BISG) is a technique that measures the maximum operating speed
(Fmax) of a circuit under test in silicon. Traditionally, it has been used in supporting …

Process variation cause a big variation on chip performance, so we need to apply expensive
functional test to do the speed binning. In this work, we propose a machine learning-based …

Hardware trojan insertion and intellectual property (IP) theft are two major concerns when
dealing with untrusted foundries. Most obfuscation techniques have a limited capability of …

Accurate minimum operating voltage (Vmin) prediction is a critical element in manufacturing
tests. Conventional methods lack coverage guarantees in interval predictions. Conformal …

Performance screening is an essential test for modern automotive microcontrollers (MCUs).
Such a test determines the maximum achievable frequency F MAX of the MCU. On-chip ring …

Predicting the minimum operating voltage ($ V_ {min} $) of chips stands as a crucial
technique in enhancing the speed and reliability of manufacturing testing flow. However …

This paper presents a framework which can avoid the lengthy system test by utilizing
machine-learning techniques to classify parts into different DVFS bins based on the results …