Advances in La-based high-k dielectrics for MOS applications

LN Liu, WM Tang, PT Lai - Coatings, 2019 - mdpi.com
This paper reviews the studies on La-based high-k dielectrics for metal-oxide-semiconductor
(MOS) applications in recent years. According to the analyses of the physical and chemical …

Strain-induced changes to the electronic structure of germanium

H Tahini, A Chroneos, RW Grimes… - Journal of Physics …, 2012 - iopscience.iop.org
Density functional theory calculations (DFT) are used to investigate the strain-induced
changes to the electronic structure of biaxially strained (parallel to the (001),(110) and (111) …

Monolithic metal–semiconductor–metal heterostructures enabling next-generation germanium nanodevices

L Wind, M Sistani, Z Song, X Maeder… - … applied materials & …, 2021 - ACS Publications
Low-dimensional Ge is perceived as a promising building block for emerging optoelectronic
devices. Here, we present a wafer-scale platform technology enabling monolithic Al-Ge-Al …

Ge interface engineering using ultra-thin La2O3 and Y2O3 films: A study into the effect of deposition temperature

IZ Mitrovic, M Althobaiti, AD Weerakkody… - Journal of Applied …, 2014 - pubs.aip.org
A study into the optimal deposition temperature for ultra-thin La 2 O 3/Ge and Y 2 O 3/Ge
gate stacks has been conducted in this paper with the aim to tailor the interfacial layer for …

The effect of La2O3-incorporation in HfO2 dielectrics on Ge substrate by atomic layer deposition

I Oh, MK Kim, J Lee, CW Lee, C Lansalot-Matras… - Applied surface …, 2013 - Elsevier
We compared the electrical properties of HfO 2, HfO 2/La 2 O 3, and La-doped HfO 2 gate
insulators deposited on Ge substrate using an atomic layer deposition (ALD) process …

Diffusion of tin in germanium: A GGA+ U approach

H Tahini, A Chroneos, RW Grimes… - Applied Physics …, 2011 - pubs.aip.org
Density functional theory calculations are used to investigate the formation and diffusion of
tin-vacancy pairs (SnV) in germanium (Ge). Depending upon the Fermi energy, SnV pairs …

O3-based atomic layer deposition of hexagonal La2O3 films on Si (100) and Ge (100) substrates

L Lamagna, C Wiemer, M Perego, SN Volkos… - Journal of Applied …, 2010 - pubs.aip.org
The hexagonal phase of La 2 O 3 is obtained upon vacuum annealing of hydroxilated La 2
O 3 films grown with atomic layer deposition at 200 C using La (P i rCp) 3 and O 3⁠. A …

A facile synthesis of shell-shaped GeOx (x≤ 2) islands by metal-assisted chemical etching of Ge and their optoelectronic properties

A Dutta, P Maiti, SK Srivastava, T Som - Optical Materials, 2022 - Elsevier
Here we report a facile synthesis of GeO x islands on Ge substrates, having a unique shell-
shaped microstructure, and investigate its optoelectronic properties. In this study, Ge …

Impurity diffusion, point defect engineering, and surface/interface passivation in germanium

A Chroneos, U Schwingenschlögl… - Annalen der …, 2012 - Wiley Online Library
In recent years germanium has been emerging as a mainstream material that could have
important applications in the microelectronics industry. The principle aim of this study is to …

Formation and characterization of holmium oxide on germanium‐based metal‐oxide‐semiconductor capacitor

TAM Onik, HF Hawari, MFM Sabri… - International Journal of …, 2021 - Wiley Online Library
The influence of different thermal oxidation/nitridation durations (5, 10, 15, and 20 minutes)
at 400° C for transforming metallic Ho sputtered on Ge substrate in N2O gas ambient have …