Robust UV/VUV/EUV PureB photodiode detector technology with high CMOS compatibility

LK Nanver, L Qi, V Mohammadi… - IEEE Journal of …, 2014 - ieeexplore.ieee.org
This paper gives an assessment of old and new data relevant to the optical and electrical
performance of PureB photodiodes for application in the wavelength range 2 nm to 400 nm …

UV-sensitive low dark-count PureB single-photon avalanche diode

L Qi, KRC Mok, M Aminian, E Charbon… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
A single-photon avalanche diode with high sensitivity in the ultraviolet (UV) wavelength
range has been fabricated on Si using pure boron chemical vapor deposition to create both …

Limits on thinning of boron layers with/without metal contacting in PureB Si (photo) diodes

T Knežević, X Liu, E Hardeveld… - IEEE electron device …, 2019 - ieeexplore.ieee.org
A little more than a monolayer-thick pure-boron (PureB) layer was deposited on silicon at
250° C by chemical vapor deposition (CVD), forming junctions with low saturation current …

Boron-layer silicon photodiodes for high-efficiency low-energy electron detection

A Šakić, LK Nanver, TLM Scholtes, CTH Heerkens… - Solid-state …, 2011 - Elsevier
Silicon photodiodes for use as low-energy electron detectors have been fabricated using a
pure-boron technology to form the p+-anode region. The diode I–V characteristics are ideal …

Temperature dependence of chemical-vapor deposition of pure boron layers from diborane

V Mohammadi, WB De Boer, LK Nanver - Applied Physics Letters, 2012 - pubs.aip.org
Surface reaction mechanisms are investigated to determine the activation energies of pure
boron (PureB) layer deposition at temperatures from 350 C to 850 C when using chemical …

Comparison of B2O3 and BN deposited by atomic layer deposition for forming ultrashallow dopant regions by solid state diffusion

S Consiglio, RD Clark, D O'Meara, CS Wajda… - Journal of Vacuum …, 2016 - pubs.aip.org
In this study, the authors investigated atomic layer deposition (ALD) of B 2 O 3 and BN for
conformal, ultrashallow B do** applications and compared the effect of dopant-containing …

Conductance along the interface formed by 400° C pure boron deposition on silicon

L Qi, LK Nanver - IEEE Electron Device Letters, 2014 - ieeexplore.ieee.org
The conductance along the interface between an as-deposited pure boron layer and n-type
Si, fabricated at 400° C, is found to be reliably formed with high-ohmic sheet resistance …

VUV/Low-Energy Electron Si Photodiodes With Postmetal 400 PureB Deposition

V Mohammadi, L Qi, N Golshani… - IEEE Electron …, 2013 - ieeexplore.ieee.org
Pure boron (PureB) chemical-vapor deposition performed at 400° C is applied as a
postmetalization process module to fabricate near-ideal p+ n photodiodes with nm-thin …

Surface-charge-collection-enhanced high-sensitivity high-stability silicon photodiodes for DUV and VUV spectral ranges

L Shi, S Nihtianov, L Haspeslagh… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
The electrical and optical performance of silicon pure-boron (Pure-B) diode is investigated in
relationship to the thermal processing used after formation of the PureB chemical-vapor …

Temperature dependency of the kinetics of PureB CVD deposition over patterned Si/SiO2 surfaces

V Mohammadi, N Golshani, KRC Mok… - Microelectronic …, 2014 - Elsevier
Temperature dependency of the kinetics of PureB CVD deposition over patterned Si/SiO 2
surfaces has been investigated. It has been shown that there is a large difference between …