Subbandgap laser-induced single event effects: Carrier generation via two-photon absorption

D McMorrow, WT Lotshaw, JS Melinger… - … on Nuclear Science, 2002 - ieeexplore.ieee.org
Carrier generation based on subbandgap two-photon absorption is demonstrated and
shown to be a viable alternative to the conventional single-photon excitation approach in …

Pulsed-laser testing for single-event effects investigations

SP Buchner, F Miller, V Pouget… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated
circuits and devices is described. The role of a pulsed laser is to provide spatial and …

Heavy ion-induced digital single-event transients in deep submicron processes

J Benedetto, P Eaton, K Avery, D Mavis… - … on Nuclear Science, 2004 - ieeexplore.ieee.org
Single-event transients (SETs) in digital circuits/processes are examined. SETs appear to
substantially mitigate traditional SEU static-latch hardening techniques below 0.25/spl mu/m …

A hardened-by-design technique for RF digital phase-locked loops

TD Loveless, LW Massengill, BL Bhuva… - IEEE transactions on …, 2006 - ieeexplore.ieee.org
A RHBD topology for digital phase-locked loops (DPLLs) has been developed for single-
event transient (SET) mitigation. By replacing the vulnerable current-based charge pump …

Single event transient pulsewidth measurements using a variable temporal latch technique

P Eaton, J Benedetto, D Mavis, K Avery… - IEEE transactions on …, 2004 - ieeexplore.ieee.org
A new test structure was designed for measuring the pulsewidths of transients created by
SETs. Experimental data was gathered using heavy ions from LETs of 11.5 to 84MeV …

Three-dimensional map** of single-event effects using two photon absorption

D McMorrow, WT Lotshaw, JS Melinger… - … on Nuclear Science, 2003 - ieeexplore.ieee.org
Carrier generation based on subbandgap two-photon absorption is used to perform three-
dimensional map** of the single-event transient response of the LM124 operational …

Modeling and mitigating single-event transients in voltage-controlled oscillators

TD Loveless, LW Massengill… - IEEE Transactions on …, 2007 - ieeexplore.ieee.org
Voltage-controlled oscillators (VCOs) have been shown to dominate the single-event
transient (SET) response of mixed-signal circuits such as the phase-locked loop (PLL). An …

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

RA Reed, J Kinnison, JC Pickel… - … on Nuclear Science, 2003 - ieeexplore.ieee.org
Over the past 27 years, or so, increased concern over single-event effects (SEEs) in
spacecraft systems has resulted in research, development, and engineering activities …

Quantitative prediction of ion-induced single-event transients in an operational amplifier using a quasi-bessel beam pulsed-laser approach

JM Hales, A Ildefonso, SP Buchner… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
A recently mymargin developed pulsed-laser (PL) testing approach, which uses a quasi-
Bessel beam (QBB) to better emulate a heavy-ion charge profile, is employed to predict the …

Towards SET mitigation in RF digital PLLs: From error characterization to radiation hardening considerations

Y Boulghassoul, LW Massengill… - … on Nuclear Science, 2006 - ieeexplore.ieee.org
In this work, the characteristics of single-event transient (SET) generation and propagation
are analyzed in a digital phase-locked loop (DPLL) circuit, designed to achieve speeds …