Impact Ionization Coefficients of Digital Alloy and Random Alloy Al0.85Ga0.15As0.56Sb0.44 in a Wide Electric Field Range

B Guo, X **, S Lee, SZ Ahmed… - Journal of Lightwave …, 2022 - ieeexplore.ieee.org
Digital alloy and random alloy Al 0.85 Ga 0.15 As 0.56 Sb 0.44 avalanche photodiodes
(APDs) exhibit low excess noise, comparable to Si APDs. Consequently, this material is a …

Impact ionization in InAs electron avalanche photodiodes

ARJ Marshall, JPR David… - IEEE Transactions on …, 2010 - ieeexplore.ieee.org
A systematic study of impact ionization, avalanche multiplication, and excess noise in InAs
diodes has been carried out, confirming that avalanche multiplication is dominated by the …

[HTML][HTML] Demonstration of large ionization coefficient ratio in AlAs0. 56Sb0. 44 lattice matched to InP

X Yi, S **e, B Liang, LW Lim, X Zhou, MC Debnath… - Scientific reports, 2018 - nature.com
The electron and hole avalanche multiplication characteristics have been measured in bulk
AlAs 0.56 Sb 0.44 pin and nip homojunction diodes, lattice matched to InP, with nominal …

Extremely low excess noise in InAs electron avalanche photodiodes

ARJ Marshall, CH Tan, MJ Steer… - IEEE Photonics …, 2009 - ieeexplore.ieee.org
Measurements of the avalanche multiplication noise in InAs pin and nip diodes at room
temperature demonstrate unambiguously that the avalanche multiplication process is …

[LLIBRE][B] InGaAs avalanche photodiodes for ranging and Lidar

AS Huntington - 2020 - books.google.com
InGaAs Avalanche Photodiodes for Ranging and Lidar discusses the materials, physics, and
design considerations of avalanche photodiodes (APDs) developed for 3D imaging sensors …

Analysis of breakdown probabilities in avalanche photodiodes using a history-dependent analytical model

S Wang, F Ma, X Li, G Karve, X Zheng… - Applied Physics …, 2003 - pubs.aip.org
The breakdown probabilities of avalanche photodiodes (APDs) working in the Geiger mode
are analyzed using a history-dependent analytical impact-ionization model [RJ McIntyre …

Temperature dependence of gain and excess noise in InAs electron avalanche photodiodes

PJ Ker, JPR David, CH Tan - Optics express, 2012 - opg.optica.org
Measurement and analysis of the temperature dependence of avalanche gain and excess
noise in InAs electron avalanche photodiodes (eAPDs) at 77 to 250 K are reported. The …

High-performance room temperature 2.75 µm cutoff In0.22Ga0.78As0.19Sb0.81/Al0.9Ga0.1As0.08Sb0.92 avalanche photodiode

X **, S Zhao, AP Craig, Q Tian, L Gilder, X Yi… - Optica, 2024 - opg.optica.org
Extended shortwave infrared (eSWIR) detectors capable of detecting wavelengths between
1.7 and 2.7 µm are useful for a wide range of applications, such as remote sensing and …

Avalanche multiplication in Al/sub x/Ga/sub 1-x/As (x= 0 to 0.60)

SA Plimmer, JPR David, R Grey… - IEEE Transactions on …, 2000 - ieeexplore.ieee.org
Electron and hole multiplication characteristics, M/sub e/and M/sub h/, have been measured
in Al/sub x/Ga/sub 1-x/As (x= 0-0.60) homojunction p/sup+/-in/sup+/diodes with i-region …

Simulation of Al0.85Ga0.15As0.56Sb0.44 avalanche photodiodes

JD Taylor-Mew, JD Petticrew, CH Tan, JS Ng - Optics Express, 2022 - opg.optica.org
Al_0. 85Ga_0. 15As_0. 56Sb_0. 44 is a promising avalanche material for near infrared
avalanche photodiodes (APDs) because they exhibit very low excess noise factors …