A holistic approach on Junctionless dual material double gate (DMDG) MOSFET with high k gate stack for low power digital applications

S Darwin, TS Arun Samuel - silicon, 2020 - Springer
The 2D analytical models for electrostatic potential, threshold voltage, subthreshold swing,
Drain Induced Barrier Lowering (DIBL) and drain current of the Dual Material Double Gate …

Symmetric operation in an extended back gate JLFET for scaling to the 5-nm regime considering quantum confinement effects

S Sahay, MJ Kumar - IEEE Transactions on Electron Devices, 2016 - ieeexplore.ieee.org
In this paper, we propose a double gate junctionless FET (DGJLFET) with an extended back
gate (EBG) architecture for significantly improved performance in the sub-10-nm regime …

Subthreshold modeling of tri-gate junctionless transistors with variable channel edges and substrate bias effects

D Gola, B Singh, PK Tiwari - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
In this paper, subthreshold channel potential, current, swing, threshold voltage, and drain-
induced barrier lowering models of short-channel tri-gate junctionless field-effect transistors …

A threshold voltage model of tri-gate junctionless field-effect transistors including substrate bias effects

D Gola, B Singh, PK Tiwari - IEEE Transactions on Electron …, 2017 - ieeexplore.ieee.org
In this paper, the influence of substrate bias voltage and substrate-induced surface potential
(SISP) on threshold voltage of tri-gate junctionless field-effect transistors (TG-JLFETs) has …

Static and quasi-static drain current modeling of tri-gate junctionless transistor with substrate bias-induced effects

D Gola, B Singh, J Singh, S Jit… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
In this paper, a surface potential-based drain current model is developed to explore the
static and quasi-static performance of substrate-biased tri-gate junctionless field-effect …

Impact of back gate bias on analog performance of do**less transistor

R Kumar, M Panchore - Transactions on Electrical and Electronic Materials, 2023 - Springer
In this brief, the impact of back gate bias (V gb), on analog performance of silicon on
insulator do**less transistor (SOI-DLT) is investigated. It is observed that SOI-DLTs are …

Analytical model for the dynamic behavior of triple-gate junctionless nanowire transistors

R Trevisoli, RT Doria, M de Souza… - … on Electron Devices, 2015 - ieeexplore.ieee.org
This paper presents an analytical model for the intrinsic capacitances and
transconductances of triple-gate junctionless nanowire transistors. The model is based on a …

Junctionless nanowire transistors operation at temperatures down to 4.2 K

R Trevisoli, M De Souza, RT Doria… - Semiconductor …, 2016 - iopscience.iop.org
The aim of this work is to analyze the operation of junctionless nanowire transistors down to
the liquid helium temperature. The drain current, the transconductance, the output …

Analysis of the electrical parameters of SOI junctionless nanowire transistors at high temperatures

TA Ribeiro, S Barraud… - IEEE Journal of the …, 2021 - ieeexplore.ieee.org
This work studies the effects of the temperature variation, from 300K to 500K, on the
electrical parameters of SOI n-type and p-type junctionless nanowire transistors. The …

The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs

IK Chen, SC Chen, S Mukhopadhyay… - 2018 IEEE …, 2018 - ieeexplore.ieee.org
This work presents a systematic study of the off-state drain bias time dependent dielectric
breakdown (TDDB) mechanism, especially for the short channel transistors in advanced …