Fast, high-resolution, non-destructive and quantitative characterization methods are needed
to develop materials with tailored properties at the nanoscale or to understand the …

Heat transfer, electrical potential and light energy are common ways to activate chemical
reactions. Applied force is another way, but dedicated studies for such a mechanical …

An advanced scanning probe microscopy system enhanced with artificial intelligence (AI‐
SPM) designed for self‐driving atomic‐scale measurements is presented. This system …

Using molecular dynamics simulations and a coarse-grained model of ionic liquids (ILs), we
study mechanisms of electrotunable friction measured in friction force microscopy …

We present an automation system for conditioning a scanning probe microscopy (SPM)
probe into different states on a Si (111)–(7× 7) surface at room temperature. Topography …

Achieving atomic-level characterization of the diamond (001) surface has been a persistent
goal over recent decades. This pursuit aims to understand the smooth growth of diamonds …

Silicene is a two-dimensional material with a honeycomb structure of silicon atoms that
exhibits exotic electronic properties. Exploring Si adatom on monolayer silicene opens up …

Silicene is a two-dimensional atomic layer material with buckled honeycomb arrangements
of Si atoms. The diversity of those arrangements, which expands its potential applications …

The manual identification and in situ correction of the state of the scanning probe tip is one
of the most time-consuming and tedious processes in atomic-resolution scanning probe …

Frequency modulation atomic force microscopy detects the interaction force between the tip
and the sample by measuring the change in the resonance frequency of an oscillating force …