Advancements and Hurdles in Contact Engineering for Miniaturized Sub-Micrometer Oxide Semiconductor Devices

JH Jeong, JE Oh, D Kim, D Ha, JK Jeong - Journal of Materials …, 2025 - pubs.rsc.org
With conventional silicon-based devices approaching their physical scaling limits,
alternative channel materials, such as transition metal dichalcogenides and oxide …

Wafer-Scale Atomic Layer-Deposited TeOx/Te Heterostructure P-Type Thin-Film Transistors

P Tan, C Niu, Z Lin, JY Lin, L Long, Y Zhang, G Wilk… - Nano Letters, 2024 - ACS Publications
There is an increasing demand for p-type semiconductors with scalable growth, excellent
device performance, and back-end-of-line (BEOL) compatibility. Recently, tellurium (Te) has …

Electronic Impact of High-Energy Metal Deposition on Ultrathin Oxide Semiconductors

YY Pan, MJ Kuo, SC Chen, T Ahmed, R Tseng… - Nano …, 2025 - ACS Publications
High-energy metal deposition significantly impacts the performance and reliability of two-
dimensional (2D) semiconductors and nanodevices. This study investigates the localized …

Highly Robust All-Oxide Transistors Toward Vertical Logic and Memory

Z Lin, Z Zhang, C Niu, H Dou, K Xu… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this work, we report atomic-layer-deposited (ALD) based all-oxide transistors toward
vertically stacked high-density logic and memory for 3-D integration. This structure utilizes …

Ultralow Voltage Operation of p-and n-FETs Enabled by Self-Formed Gate Dielectric and Metal Contacts on 2D Tellurium

C Niu, L Long, Y Zhang, Z Lin, P Tan, JY Lin… - arxiv preprint arxiv …, 2024 - arxiv.org
The ongoing demand for more energy-efficient, high-performance electronics is driving the
exploration of innovative materials and device architectures, where interfaces play a crucial …

Ab Initio Device-Driven Screening of Sub-1-nm Thickness Oxide Semiconductors for Future CMOS Technology Nodes

L Xu, Y Hu, L Xu, L Xu, Q Li, A Wang, CS Lau… - arxiv preprint arxiv …, 2024 - arxiv.org
Ultrathin oxide semiconductors with sub-1-nm thickness are promising building blocks for
ultrascaled field-effect transistor (FET) applications due to their resilience against short …