In order to accelerate an algorithm for test generation, it is necessary to reduce the number
of backtracks in the algorithm and to shorten the process time between backtracks. In this …

We present an alternative to fault simulation, referred to as critical path tracing, that
determines the faults detected by a set of tests using a backtracing algorithm starting at the …

A description is given of Gentest, with emphasis on STG2, a sequential test generator that
uses the Back test-generation algorithm and the Split value model. The performance of …

This paper describes a test generation system capable of high fault coverage in complex
sequential circuits. Sequential logic is efficiently processed by a unidirectional time flow …

ABSTRACT SEARCH ALGORITHMS FOR SATISFIABILITY PROBLEMS IN
COMBINATIONAL SWITCHING CIRCUITS by João Paulo Marques da Silva Chair: Karem A …

The authors present a novel test pattern generation algorithm which uses the concept of
necessary assignments to reduce or eliminate backtracking in automatic test pattern …

A behavioral test generation algorithm (called the B-algorithm) is presented which generates
tests directly from behavioral VHDL circuit descriptions using three types of behavioral faults …

For pt. I see ibid., p. 857-66 (1988). A novel algebra is introduced for delay test generation.
The algebra combines the nine natural logic values (00, 01, 0X, 10, 11, 1X, X1, XX) with …

Modular products and reconfigurable testing processes are crucial in modern
manufacturing. This paper discusses the concept of product modularity, test modules of …

The authors present an algorithm for hierarchical test generation based on module-oriented
decision making (MODEM). The algorithm deals with combinational logic modules and the …