Evidence of microscopic inhomogeneities of the side source/drain contacts in 300 mm wafer
integrated MoS2 field-effect transistors is presented. In particular, the presence of a limited …

Markov chain (MC) is a stochastic model that describes a sequence of events where the
probability of each event depends only on the previous state. Such memoryless property …

As well known, the implementation of high-κ dielectrics (eg, HfO_2) in nanoscale devices is
unavoidable to cope with the device scaling required by the market. Nevertheless, due to the …

Abstract Through Random Telegraph Noise (RTN) analysis, valuable information can be
provided about the role of defect traps in fine tuning and reading of the state of a …

Being one of the most relevant reliability issues in electron devices, dielectric breakdown
(BD) has been in the spotlight for over 50 years and the quest for a comprehensive BD …

Despite the various well-established theories such as the thermochemical (E-model), E-
model, power law (VN-model), and 1/E-model, accurately replicate dielectric breakdown …