Recommended methods to study resistive switching devices

M Lanza, HSP Wong, E Pop, D Ielmini… - Advanced Electronic …, 2019‏ - Wiley Online Library
Resistive switching (RS) is an interesting property shown by some materials systems that,
especially during the last decade, has gained a lot of interest for the fabrication of electronic …

Recent development of PeakForce Tap** mode atomic force microscopy and its applications on nanoscience

K Xu, W Sun, Y Shao, F Wei, X Zhang… - Nanotechnology …, 2018‏ - degruyter.com
Nanoscience is a booming field incorporating some of the most fundamental questions
concerning structure, function, and applications. The cutting-edge research in nanoscience …

Scanning probe microscopy for advanced nanoelectronics

F Hui, M Lanza - Nature electronics, 2019‏ - nature.com
As the size of electronic devices continues to shrink, characterization methods capable of
precisely probing localized properties become increasingly important. Scanning probe …

Real-time in situ optical tracking of oxygen vacancy migration in memristors

G Di Martino, A Demetriadou, W Li, D Kos, B Zhu… - Nature …, 2020‏ - nature.com
Resistive switches, which are also known as memristors, are low-power, nanosecond-
response devices that are used in a range of memory-centric technologies. Driven by an …

Dielectric Properties of Ultrathin CaF2 Ionic Crystals

C Wen, AG Banshchikov, YY Illarionov… - Advanced …, 2020‏ - Wiley Online Library
Mechanically exfoliated 2D hexagonal boron nitride (h‐BN) is currently the preferred
dielectric material to interact with graphene and 2D transition metal dichalcogenides in …

Conductive atomic force microscope study of bipolar and threshold resistive switching in 2D hexagonal boron nitride films

A Ranjan, N Raghavan, SJ O'shea, S Mei, M Bosman… - Scientific reports, 2018‏ - nature.com
This study investigates the resistive switching characteristics and underlying mechanism in
2D layered hexagonal boron nitride (h-BN) dielectric films using conductive atomic force …

[HTML][HTML] Probing resistive switching in HfO2/Al2O3 bilayer oxides using in-situ transmission electron microscopy

A Ranjan, H Xu, C Wang, J Molina, X Wu, H Zhang… - Applied Materials …, 2023‏ - Elsevier
In this work, we investigate the resistive switching in hafnium dioxide (HfO 2) and aluminum
oxide (Al 2 O 3) bilayered stacks using in-situ transmission electron microscopy and X-ray …

Understanding the Resistive Switching Phenomena of Stacked Al/Al2O3/Al Thin Films from the Dynamics of Conductive Filaments

J Molina-Reyes, L Hernandez-Martinez - Complexity, 2017‏ - Wiley Online Library
We present the resistive switching characteristics of Metal‐Insulator‐Metal (MIM) devices
based on amorphous Al2O3 which is deposited by Atomic Layer Deposition (ALD). A …

Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum

AK Singh, S Blonkowski, M Kogelschatz - Journal of Applied Physics, 2018‏ - pubs.aip.org
This study aims to characterize the oxide based Resistive Random Access Memory memory
cell at the nanoscale. Resistive memory stacks were characterized by conductive atomic …

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

F Piquemal, K Kaja, P Chrétien… - Beilstein Journal of …, 2023‏ - beilstein-journals.org
Measuring resistances at the nanoscale has attracted recent attention for develo**
microelectronic components, memory devices, molecular electronics, and two-dimensional …