Iterative learning control for video-rate atomic force microscopy

N Nikooienejad, M Maroufi… - … /ASME Transactions on …, 2020‏ - ieeexplore.ieee.org
We present a control scheme for video-rate atomic force microscopy with rosette pattern. The
controller structure involves a feedback internal-model-based controller and a feedforward …

Performance of sinusoidal scanning with MPC in AFM imaging

MS Rana, HR Pota, IR Petersen - IEEE/ASME Transactions on …, 2014‏ - ieeexplore.ieee.org
An atomic force microscope (AFM) is an extremely versatile investigative tool in the field of
nanotechnology, the performance of which is significantly influenced by its conventional zig …

Improvement in the imaging performance of atomic force microscopy: A survey

MS Rana, HR Pota, IR Petersen - IEEE Transactions on …, 2016‏ - ieeexplore.ieee.org
Nanotechnology is the branch of science which deals with the manipulation of matters at an
extremely high resolution down to the atomic level. In recent years, atomic force microscopy …

Finite-time learning control using frequency response data with application to a nanopositioning stage

R de Rozario, A Fleming… - IEEE/ASME Transactions …, 2019‏ - ieeexplore.ieee.org
Learning control enables significant performance improvement for systems that perform
repeating tasks. Achieving high tracking performance by utilizing past error data typically …

Robust repetitive controller for fast AFM imaging

S Necipoglu, SA Cebeci, YE Has… - IEEE Transactions …, 2011‏ - ieeexplore.ieee.org
Currently, atomic force microscopy (AFM) is the most preferred scanning probe microscopy
method due to its numerous advantages. However, increasing the scanning speed and …

High-speed adaptive contact-mode atomic force microscopy imaging with near-minimum-force

J Ren, Q Zou - Review of Scientific Instruments, 2014‏ - pubs.aip.org
In this paper, an adaptive contact-mode imaging approach is proposed to replace the
traditional contact-mode imaging by addressing the major concerns in both the speed and …

High-speed atomic force microscope imaging: Adaptive multiloop mode

J Ren, Q Zou, B Li, Z Lin - Physical Review E, 2014‏ - APS
In this paper, an imaging mode (called the adaptive multiloop mode) of atomic force
microscope (AFM) is proposed to substantially increase the speed of tap** mode (TM) …

[HTML][HTML] Increased imaging speed and force sensitivity for bio-applications with small cantilevers using a conventional AFM setup

M Leitner, GE Fantner, EJ Fantner, K Ivanova, T Ivanov… - Micron, 2012‏ - Elsevier
In this study, we demonstrate the increased performance in speed and sensitivity achieved
by the use of small AFM cantilevers on a standard AFM system. For this, small rectangular …

Novel control scheme for a high-speed metrological scanning probe microscope

N Vorbringer-Dorozhovets, T Hausotte… - Measurement …, 2011‏ - iopscience.iop.org
Some time ago, an interferometer-based metrological scanning probe microscope (SPM)
was developed at the Institute of Process Measurement and Sensor Technology of the …

An iterative-based feedforward-feedback control approach to high-speed atomic force microscope imaging

Y Wu, Q Zou - 2009‏ - asmedigitalcollection.asme.org
This article presents an iterative-based feedforward-feedback control approach to achieve
high-speed atomic force microscope (AFM) imaging. AFM-imaging requires precision …