Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Mitigation of radiation effects in SRAM-based FPGAs for space applications
The use of static random access memory (SRAM)-based field programmable gate arrays
(FPGAs) in harsh radiation environments has grown in recent years. These types of …
(FPGAs) in harsh radiation environments has grown in recent years. These types of …
A survey on two-dimensional Error Correction Codes applied to fault-tolerant systems
The number of memory faults operating in radiation environments increases with the
electronic device miniaturization. One-dimensional (1D) Error Correction Codes (ECCs) are …
electronic device miniaturization. One-dimensional (1D) Error Correction Codes (ECCs) are …
A method and case study on identifying physically adjacent multiple-cell upsets using 28-nm, interleaved and SECDED-protected arrays
Extracting information about MCUs from SEU data sets can be a challenge without physical
layout information. Many modern static-random access memory (SRAM) components …
layout information. Many modern static-random access memory (SRAM) components …
On the radiation-induced soft error performance of hardened sequential elements in advanced bulk CMOS technologies
N Seifert, V Ambrose, B Gill, Q Shi… - 2010 IEEE …, 2010 - ieeexplore.ieee.org
Test chips built in a 32 nm bulk CMOS technology consisting of hardened and non-
hardened sequential elements have been exposed to neutrons, protons, alpha-particles and …
hardened sequential elements have been exposed to neutrons, protons, alpha-particles and …
Ionizing Radiation Effectsin Electronics
M Bagatin, S Gerardin - 2016 - api.taylorfrancis.com
There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …
Challenges in testing complex systems
Many space programs depend on cutting-edge technology to increase computational power
without increasing the power or weight of the payload. For these types of programs …
without increasing the power or weight of the payload. For these types of programs …
Domain crossing errors: Limitations on single device triple-modular redundancy circuits in **linx FPGAs
This paper discusses the limitations of single-FPGA triple-modular redundancy in the
presence of multiple-bit upsets on **linx Virtex-II devices. This paper presents results from …
presence of multiple-bit upsets on **linx Virtex-II devices. This paper presents results from …
Radiation effects in reconfigurable FPGAs
Field-programmable gate arrays (FPGAs) are co-processing hardware used in image and
signal processing. FPGA are programmed with custom implementations of an algorithm …
signal processing. FPGA are programmed with custom implementations of an algorithm …
Multi-cell upset probabilities of 45nm high-k+ metal gate SRAM devices in terrestrial and space environments
N Seifert, B Gill, K Foley… - 2008 IEEE International …, 2008 - ieeexplore.ieee.org
Multi-cell soft errors are a key reliability concern for advanced memory devices. We have
investigated single-bit (SBU) and multi-cell upset (MCU) rates of SRAM devices built in a 45 …
investigated single-bit (SBU) and multi-cell upset (MCU) rates of SRAM devices built in a 45 …
[کتاب][B] Radiation effects in semiconductors
K Iniewski - 2018 - taylorfrancis.com
Space applications, nuclear physics, military operations, medical imaging, and especially
electronics (modern silicon processing) are obvious fields in which radiation damage can …
electronics (modern silicon processing) are obvious fields in which radiation damage can …