SiC devices: physics and numerical simulation

M Ruff, H Mitlehner, R Helbig - IEEE Transactions on electron …, 1994 - ieeexplore.ieee.org
The important material parameters for 6H silicon carbide (6H-SiC) are extracted from the
literature and implemented into the 2-D device simulation programs PISCES and …

Electron mobility models for 4H, 6H, and 3C SiC [MESFETs]

M Roschke, F Schwierz - IEEE Transactions on electron …, 2001 - ieeexplore.ieee.org
Models for the electron mobility in the three most important silicon carbide (SiC) polytypes,
namely, 4H, 6H, and 3C SiC are developed. A large number of experimental mobility data …

Monte Carlo study of electron transport in SiC

R Mickevičius, JH Zhao - Journal of applied physics, 1998 - pubs.aip.org
Temperature-and electric field-dependent electron transport in 3C–, 4H–, and 6H–SiC has
been calculated by the Monte Carlo technique. Due to the freezeout of deep donor levels the …

Phonon-limited carrier mobility and temperature-dependent scattering mechanism of -SiC from first principles

F Meng, J Ma, J He, W Li - Physical Review B, 2019 - APS
Electron-phonon coupling is at the core of various regimes of material-based science and
technology. Taking 3 C-silicon carbide (3 C-SiC) as an example, despite its very wide …

Mobility of two‐dimensional hole gas in H‐terminated diamond

Y Li, JF Zhang, GP Liu, ZY Ren… - physica status solidi …, 2018 - Wiley Online Library
The two‐dimensional hole gas (2DHG) induced at H‐terminated diamond surface provides
the most widely used room‐temperature surface electrical conductance of diamond …

Monte Carlo simulation of electron transport in 4H–SiC using a two‐band model with multiple minima

HE Nilsson, U Sannemo, CS Petersson - Journal of applied physics, 1996 - pubs.aip.org
A Monte Carlo study of the high‐field electron transport in 4H–SiC is presented using a new
analytic band model. The band model consists of two analytical bands that include band …

Monte Carlo calculations of the temperature‐and field‐dependent electron transport parameters for 4H‐SiC

RP Joshi - Journal of Applied Physics, 1995 - pubs.aip.org
Monte Carlo simulation results for the field‐and temperature‐dependent electronic
mobilities, drift velocities, and diffusion coefficients in 4H‐SiC are presented. The …

Ensemble Monte Carlo calculation of hole transport in bulk

E Bellotti, HE Nilsson, KF Brennan… - Journal of applied …, 1999 - pubs.aip.org
In this article the first calculation of hole transport in the 3C phase of SiC is presented. The
salient features of the model are the full band-structure computed by the empirical …

Hall mobility and scattering mechanism of holes in boron-doped homoepitaxial chemical vapor deposition diamond thin films

K Tsukioka, H Okushi - Japanese journal of applied physics, 2006 - iopscience.iop.org
The temperature dependence of the Hall mobility µ H has been measured from 140 to 870 K
for nine boron-doped homoepitaxial chemical vapor deposition (CVD) diamond thin films …

Electrical properties of epitaxial 3C-and 6H-SiC pn junction diodes produced side-by-side on 6H-SiC substrates

PG Neudeck, DJ Larkin, JE Starr… - IEEE transactions on …, 1994 - ieeexplore.ieee.org
3C-SiC (/spl beta/-SiC) and 6H-SiC pn junction diodes have been fabricated in regions of
both 3C-SiC and 6H-SiC epitaxial layers which were grown side-by-side on low-tilt-angle 6H …