State of the art and future perspectives in advanced CMOS technology

HH Radamson, H Zhu, Z Wu, X He, H Lin, J Liu… - Nanomaterials, 2020 - mdpi.com
The international technology roadmap of semiconductors (ITRS) is approaching the
historical end point and we observe that the semiconductor industry is driving …

Nanosheet field effect transistors-A next generation device to keep Moore's law alive: An intensive study

J Ajayan, D Nirmal, S Tayal, S Bhattacharya… - Microelectronics …, 2021 - Elsevier
Incessant downscaling of feature size of multi-gate devices such as FinFETs and gate-all-
around (GAA) nanowire (NW)-FETs leads to unadorned effects like short channel effects …

A review of the gate-all-around nanosheet FET process opportunities

S Mukesh, J Zhang - Electronics, 2022 - mdpi.com
In this paper, the innovations in device design of the gate-all-around (GAA) nanosheet FET
are reviewed. These innovations span enablement of multiple threshold voltages and …

Miniaturization of CMOS

HH Radamson, X He, Q Zhang, J Liu, H Cui, J ** profile of stacked nanosheet transistors
H Xu, W Gan, L Cao, C Yang, J Wu… - … on Electron Devices, 2022 - ieeexplore.ieee.org
Complex nonlinear dependence of ultra-scaled transistor performance on its channel
geometry and source/drain (S/D) do** profile bring obstacles in the advanced technology …

Multi- Strategies of 7-nm node Nanosheet FETs With Limited Nanosheet Spacing

JS Yoon, J Jeong, S Lee… - IEEE Journal of the …, 2018 - ieeexplore.ieee.org
In this paper, multi-threshold voltage (V th) scheme of 7-nm node nanosheet FETs (NSFETs)
with narrow NS spacing were successfully achieved by metal-gate work function (WF) and …