Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization
We introduce a new type of microscopy which is capable of investigating surface topography
and electrical property of conductive and dielectric materials simultaneously on a nanometer …
and electrical property of conductive and dielectric materials simultaneously on a nanometer …
Microwave atomic force microscopy: quantitative measurement and characterization of electrical properties on the nanometer scale
In this paper, we report a noncontact and quantitative method of evaluating and
characterizing electrical properties with a nanometer-scale spatial resolution. Microwave …
characterizing electrical properties with a nanometer-scale spatial resolution. Microwave …
Broadband microwave absorption based on the configuration resonance of wires
The absorption efficiency of a conductive wire can be essentially increased in the broad
microwave spectrum from 4 to 12 GHz by the appropriate choice of the radius and height of …
microwave spectrum from 4 to 12 GHz by the appropriate choice of the radius and height of …
Quantitative measurement of local conductivity of SnO2 nanobelt field effect transistor utilizing microwave atomic force microscopy
A non-contact quantitative method for measuring the electrical conductivity of a SnO 2
nanobelt field-effect transistor (FET) with nanometer-scale spatial resolution is reported. The …
nanobelt field-effect transistor (FET) with nanometer-scale spatial resolution is reported. The …
Quantitative evaluation of dislocation density in SUS316L utilizing non-contact microwave reflection method
Metallic materials are widely employed due to their exceptional mechanical attributes.
Plastic deformation is a common issue that influences both the mechanical and electrical …
Plastic deformation is a common issue that influences both the mechanical and electrical …
Measurement of electrical properties of materials under the oxide layer by microwave-AFM probe
The capability of a new AFM-based apparatus named microwave atomic force microscope
(M-AFM) which can measure the topography and electrical information of samples …
(M-AFM) which can measure the topography and electrical information of samples …
Local permittivity measurement of dielectric materials based on the non-contact force curve of microwave atomic force microscopy
We report a non-contact and quantitative method to measure the local permittivity of
dielectric materials with a nanometer-scale spatial resolution. A theoretical model based on …
dielectric materials with a nanometer-scale spatial resolution. A theoretical model based on …
新型扫描微波显微术
许瑞， 郑志月， 季威， 程志海 - 物理学进展, 2015 - pip.nju.edu.cn
微波是整个电磁频谱非常重要的组成部分, 可以与物质发生丰富的相互作用; 而原子力显微术(
Atomic Force Microscopy, AFM) 有超高的空间分辨率, 是纳米研究的核心工具 …
Atomic Force Microscopy, AFM) 有超高的空间分辨率, 是纳米研究的核心工具 …