A review on control strategies for compensation of hysteresis and creep on piezoelectric actuators based micro systems

DV Sabarianand, P Karthikeyan… - Mechanical Systems and …, 2020‏ - Elsevier
The piezoelectric actuators are widely used to realize high precise motion with fractional
force and torque in both linear and rotary joints of the micro-systems. The control system …

Invited review article: High-speed flexure-guided nanopositioning: Mechanical design and control issues

YK Yong, SOR Moheimani, BJ Kenton… - Review of scientific …, 2012‏ - pubs.aip.org
Recent interest in high-speed scanning probe microscopy for high-throughput applications
including video-rate atomic force microscopy and probe-based nanofabrication has sparked …

A survey of control issues in nanopositioning

S Devasia, E Eleftheriou… - IEEE Transactions on …, 2007‏ - ieeexplore.ieee.org
Nanotechnology is the science of understanding matter and the control of matter at
dimensions of 100 nm or less. Encompassing nanoscale science, engineering, and …

High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes

T Ando, T Uchihashi, T Fukuma - Progress in Surface Science, 2008‏ - Elsevier
The atomic force microscope (AFM) has a unique capability of allowing the high-resolution
imaging of biological samples on substratum surfaces in physiological solutions. Recent …

A review of feedforward control approaches in nanopositioning for high-speed SPM

GM Clayton, S Tien, KK Leang, Q Zou, S Devasia - 2009‏ - asmedigitalcollection.asme.org
Control can enable high-bandwidth nanopositioning needed to increase the operating
speed of scanning probe microscopes (SPMs). High-speed SPMs can substantially impact …

[ספר][B] Design, modeling and control of nanopositioning systems

AJ Fleming, KK Leang - 2014‏ - Springer
This chapter provides an introduction to the design, applications, and characteristics of
piezoelectric nanopositioning systems. Particular attention is paid to the characteristics that …

Design and modeling of a high-speed AFM-scanner

G Schitter, KJ Astrom, BE DeMartini… - … on control systems …, 2007‏ - ieeexplore.ieee.org
A new mechanical scanner design for a high-speed atomic force microscope (AFM) is
presented and discussed in terms of modeling and control. The positioning range of this …

High-speed AFM and nano-visualization of biomolecular processes

T Ando, T Uchihashi, N Kodera, D Yamamoto… - … -European Journal of …, 2008‏ - Springer
Conventional atomic force microscopes (AFMs) take at least 30–60 s to capture an image,
while dynamic biomolecular processes occur on a millisecond timescale or less. To narrow …

Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation

S Tien, Q Zou, S Devasia - IEEE Transactions on Control …, 2005‏ - ieeexplore.ieee.org
This paper addresses the compensation of the dynamics-coupling effect in piezoscanners
used for positioning in atomic force microscopes (AFMs). Piezoscanners are used to position …

Imaging of nucleic acids with atomic force microscopy

YL Lyubchenko, LS Shlyakhtenko, T Ando - Methods, 2011‏ - Elsevier
Atomic force microscopy (AFM) is a key tool of nanotechnology with great importance in
applications to DNA nanotechnology and to the recently emerging field of RNA …