[PDF][PDF] Adaptation of March-SS algorithm to word-oriented memory built-in self-test and repair
The technology shrinkage and the increased demand for high storage memory devices in
today's system on-chips (SoCs) has been the challenges to the designers not only in the …
today's system on-chips (SoCs) has been the challenges to the designers not only in the …
A novel built-in self-repair scheme for 3D memory
Three-dimensional (3D) memory products based on through silicon via (TSV) are widely
developed to fulfill the ever-increasing demands of per unit area storage capacity. The yield …
developed to fulfill the ever-increasing demands of per unit area storage capacity. The yield …
In-growth test for monolithic 3D integrated SRAM
Monolithic three-dimensional integration (M3I) directly fabricates tiers of integrated circuits
upon each other and provides millions of vertical interconnections with inter-layer vias …
upon each other and provides millions of vertical interconnections with inter-layer vias …
Dynamic fault clustering method and apparatus
JS Park, KH Bae, JH Jeong, SH Bang - US Patent App. 17/898,992, 2023 - Google Patents
2022-08-31 Assigned to SK Hynix Inc., KOREA UNIVERSITY RESEARCH AND BUSINESS
FOUNDATION reassignment SK Hynix Inc. ASSIGNMENT OF ASSIGNORS INTEREST (SEE …
FOUNDATION reassignment SK Hynix Inc. ASSIGNMENT OF ASSIGNORS INTEREST (SEE …