Crystal grain nucleation in amorphous silicon

C Spinella, S Lombardo, F Priolo - Journal of Applied physics, 1998 - pubs.aip.org
The solid phase crystallization of chemical vapor deposited amorphous silicon films onto
oxidized silicon wafers, induced either by thermal annealing or by ion beam irradiation at …

Ion-beam-induced amorphization and recrystallization in silicon

L Pelaz, LA Marqués, J Barbolla - Journal of applied physics, 2004 - pubs.aip.org
Ion-beam-induced amorphization in Si has attracted significant interest since the beginning
of the use of ion implantation for the fabrication of Si devices. A number of theoretical …

[KNJIGA][B] Ion implantation: basics to device fabrication

E Rimini - 1994 - books.google.com
Ion implantation offers one of the best examples of a topic that starting from the basic
research level has reached the high technology level within the framework of …

Molecular-dynamics simulations of solid-phase epitaxy of Si: Growth mechanisms

T Motooka, K Nisihira, S Munetoh, K Moriguchi… - Physical Review B, 2000 - APS
Crystal-growth processes of Si during solid phase epitaxy (SPE) in the [001] direction have
been investigated based on molecular-dynamics (MD) simulations using the Tersoff …

Topics in solid phase epitaxy: Strain, structure and geometry

O Hellman - Materials Science and Engineering: R: Reports, 1996 - Elsevier
The effects of some experimental parameters on the solid-phase crystallization of
amorphous films on single crystals, a process known as Solid Phase Epitaxy (SPE), are …

Solid-phase epitaxy

BC Johnson, JC McCallum, MJ Aziz - Handbook of Crystal Growth, 2015 - Elsevier
We review the field of solid-phase epitaxy (SPE), a crystallization process during which
atoms undergo bonding rearrangements that allow them to transfer from a metastable …

Evidence of enhanced epitaxial crystallization at low temperature by inelastic electronic scattering of mega‐electron‐volt heavy‐ion‐beam irradiation

J Nakata - Journal of applied physics, 1996 - pubs.aip.org
The inelastic electronic scattering of 84Kr at energies of 0.5–5 MeV and 131,132 Xe ions at
energies of 1–5 MeV is directly confirmed to play a role in the ion‐beam‐induced epitaxial …

Low-temperature solid-phase crystallization of amorphous silicon thin films deposited by rf magnetron sputtering with substrate bias

SI Jun, PD Rack, TE McKnight, AV Melechko… - Applied physics …, 2006 - pubs.aip.org
The crystallization properties of amorphous silicon (a-Si) thin film deposited by rf magnetron
sputter deposition with substrate bias have been thoroughly characterized. The …

Annealing of ion-implanted defects in diamond by MeV ion-beam irradiation

J Nakata - Physical Review B, 1999 - APS
Defects and amorphous C layers or clusters in a type-Ib diamond formed by C-or P-ion
implantation under certain doses are clearly annealed or epitaxially crystallized during …

Epitaxial crystallization during 600 C furnace annealing of amorphous Si layer deposited by low-pressure chemical-vapor-deposition and irradiated with 1-MeV Xe …

J Nakata - Journal of applied physics, 1997 - pubs.aip.org
The amorphous Si layers deposited by low-pressure chemical vapor deposition on (100)-
crystal-Si substrates and subjected to Xe-ion-beam irradiation are crystallized epitaxially in a …