Material science and device physics in SiC technology for high-voltage power devices

T Kimoto - Japanese Journal of Applied Physics, 2015 - iopscience.iop.org
Power semiconductor devices are key components in power conversion systems. Silicon
carbide (SiC) has received increasing attention as a wide-bandgap semiconductor suitable …

Silicon carbide and its use as a radiation detector material

F Nava, G Bertuccio, A Cavallini… - … Science and Technology, 2008 - iopscience.iop.org
We present a comprehensive review of the properties of the epitaxial 4H silicon carbide
polytype (4H–SiC). Particular emphasis is placed on those aspects of this material related to …

Degradation of hexagonal silicon-carbide-based bipolar devices

M Skowronski, S Ha - Journal of applied physics, 2006 - pubs.aip.org
Only a few years ago, an account of degradation of silicon carbide high-voltage pin diodes
was presented at the European Conference on Silicon Carbide and Related Compounds …

Review of SiC crystal growth technology

PJ Wellmann - Semiconductor Science and Technology, 2018 - iopscience.iop.org
The review article describes the interplay of fundamental research and advanced processes
that have made SiC a unique semiconductor material for power electronic devices. Related …

SiC materials-progress, status, and potential roadblocks

AR Powell, LB Rowland - Proceedings of the IEEE, 2002 - ieeexplore.ieee.org
SiC materials are currently metamorphosing from research and development into a market
driven manufacturing product. SiC substrates are currently used as the base for a large …

SiC nanowires: material and devices

K Zekentes, K Rogdakis - Journal of Physics D: Applied Physics, 2011 - iopscience.iop.org
SiC nanowires are of high interest since they combine the physical properties of SiC with
those induced by their low dimensionality. For this reason, a large number of scientific …

Silica on silicon carbide

V Presser, KG Nickel - Critical reviews in solid state and materials …, 2008 - Taylor & Francis
Silicon carbide (SiC) as both the most important non-oxide ceramic and promising
semiconductor material grows stoichiometric SiO 2 as its native oxide. During passive …

[LIBRO][B] The VLSI handbook

WK Chen - 1999 - taylorfrancis.com
Over the years, the fundamentals of VLSI technology have evolved to include a wide range
of topics and a broad range of practices. To encompass such a vast amount of knowledge …

Interface properties of metal–oxide–semiconductor structures on 4H-SiC {0001} and (1120) formed by N2O oxidation

T Kimoto, Y Kanzaki, M Noborio… - Japanese journal of …, 2005 - iopscience.iop.org
Abstract 4H-SiC (0001),(0001), and (1120) have been directly oxidized by N 2 O at 1300 C,
and metal–oxide–semiconductor (MOS) interfaces have been characterized. The interface …

Current status and perspectives of ultrahigh-voltage SiC power devices

T Kimoto, Y Yonezawa - Materials Science in Semiconductor Processing, 2018 - Elsevier
Recent progress in the SiC material and ultrahigh-voltage devices is reviewed. Regarding
the material issues, fast epitaxial growth of high-purity epitaxial layers and reduction of basal …