Register-transfer level (RTL) scan design aims at optimizing the scan logic as well as the
original logic during logic synthesis by modifying a given RTL description to make every …

In this paper, we present an approach to constrained automatic test pattern generation
(ATPG) for functional circuits at register-transfer level (RTL) with the help of a design-for …

We propose a new test generation method for F-scan delay fault testing that uses standard
full scan delay fault automatic test pattern generation (ATPG). This method shows that it is …

Due to the difficulty of test pattern generation for sequential circuits, several design-for-
testability (DFT) approaches have been proposed. An improvement to these current …

Today's digital circuits demand both high speed performance and miniaturization of chip
size. As a result, delay fault testing has become very important to verify the quality …

Delay test patterns can be generated at the functional level of the circuit using a software
prototype model, when the primary inputs, the primary outputs and the state variables are …