CMOS reliability from past to future: A survey of requirements, trends, and prediction methods

I Hill, P Chanawala, R Singh… - … on Device and …, 2021 - ieeexplore.ieee.org
Developments in IC fabrication, emerging high-reliability markets, and government
regulations indicate potential for significant shifts in how reliability fits within IC development …

Physics-Based Reliability Modeling for Control Applications: Adaptative Control Allocation

J Liscouët, J Desrosiers, Z Heit, I Uwantare… - IEEE …, 2024 - ieeexplore.ieee.org
Unmanned Aerial Vehicles (UAVs) are increasingly utilized across various industries,
necessitating high reliability to ensure safety and reduce operational costs. This paper …

Numerical and Experimental Investigations of the Thermal Fatigue Lifetime of CBGA Packages.

B Yang, J Luo, B Wan, Y Su, G Fu… - … -Computer Modeling in …, 2022 - search.ebscohost.com
A thermal fatigue lifetime prediction model of ceramic ball grid array (CBGA) packages is
proposed based on the Darveaux model. A finite element model of the CBGA packages is …

Numerical algorithms for estimating probability density function based on the maximum entropy principle and Fup basis functions

N Brajčić Kurbaša, B Gotovac, V Kozulić, H Gotovac - Entropy, 2021 - mdpi.com
Estimation of the probability density function from the statistical power moments presents a
challenging nonlinear numerical problem posed by unbalanced nonlinearities, numerical …

Modelling Task Durations Towards Automated, Big Data, Process Mining

M Faddy, L Yang, S McClean… - … Stochastic Models in …, 2025 - Wiley Online Library
Business processes are generally time‐sensitive, impacting factors such as customer
expectations, cost efficiencies, compliance requirements, supply chain constraints, and …

Investigation of quality and identity of similar electronic components from different manufacturers

AI Vlasov, KV Selivanov… - … Conference on Industrial …, 2023 - ieeexplore.ieee.org
This research studies the failures of electronic equipment due to the use of low-quality
electronic components. This work identifies the actual specifications of semiconductor …

Gerabaldi: A Temporal Simulator for Probabilistic IC Degradation and Failure Processes

I Hill, A Ivanov - 2023 IEEE 41st VLSI Test Symposium (VTS), 2023 - ieeexplore.ieee.org
Wear-out reliability in integrated circuits is becoming an increasingly complex topic, with
emerging high-reliability markets demanding stricter requirements, diverse workloads …

[HTML][HTML] Прогнозирование класса надёжности изделий электронной техники методом преобразования информативных параметров в дискретный код

ВО Казючиц, СМ Боровиков… - … систем управления и …, 2023 - cyberleninka.ru
Предлагается модификация метода индивидуального прогнозирования класса
надёжности изделий электронной техники для заданной наработки (K1–класс …

Towards Disaster-Resilient Cities: China-Us Comparative Analysis of Public Perceptions on Urban Resilience

Y Wang, J Guo, C Shen - Available at SSRN 4844136 - papers.ssrn.com
Extreme climate events have become more frequent due to urban expansion, triggering
severe natural disasters, ie, urban floods, that have influenced cities significantly, and urban …

Assessment of digital development design model using deep learning neural network

Z Lv - Journal of Intelligent & Fuzzy Systems - content.iospress.com
In the context of China's cultural and tourism industry, cultural equipment plays a critical role
in cultural dissemination, especially in remote areas with harsh road conditions and unique …