A review of semiconductor based ionising radiation sensors used in Harsh radiation environments and their applications

A Karmakar, J Wang, J Prinzie, V De Smedt, P Leroux - Radiation, 2021 - mdpi.com
Simple Summary Ionising radiation affects electronic circuits as well as living beings and
has been a major concern for various critical applications such as healthcare, mining …

How practical are fault injection attacks, really?

J Breier, X Hou - IEEE Access, 2022 - ieeexplore.ieee.org
Fault injection attacks (FIA) are a class of active physical attacks, mostly used for malicious
purposes such as extraction of cryptographic keys, privilege escalation, attacks on neural …

Physical attack protection techniques for IC chip level hardware security

M Nagata, T Miki, N Miura - IEEE transactions on very large …, 2021 - ieeexplore.ieee.org
Secure hardware systems are threatened by adversarial attempts on integrated circuit (IC)
chips in a practical utilization environment. This article provides overviews of physical …

FISHI: Fault injection detection in secure heterogeneous integration via power noise variation

T Zhang, ML Rahman, HM Kamali… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
As Moore's law comes to a crawl, heterogeneous integration-based system-in-package
emerges as a promising direction to maintain the speedy rate of performance density …

Detecting failures and attacks via digital sensors

MTH Anik, JL Danger, S Guilley… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Detection of abnormal behaviors is essential in complex and/or strategic systems requiring a
high level of safety and security. Sensing environmental conditions to ensure that the device …

An embedded digital sensor against EM and BB fault injection

D El-Baze, JB Rigaud, P Maurine - 2016 Workshop on Fault …, 2016 - ieeexplore.ieee.org
Fault Attacks methods like Electro-Magnetic PulseInjection or Body Biasing Injection have
recently been demon-strated to be efficient against smartcards and Systems on Chip. As of …

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents

C Champeix, N Borrel, JM Dutertre… - 2015 IEEE 21st …, 2015 - ieeexplore.ieee.org
Bulk Built-In Current Sensors (BBICS) were developed to detect the transient bulk currents
induced in the bulk of integrated circuits when hit by ionizing particles or pulsed laser. This …

Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits

RP Bastos, LA Guimaraes, FS Torres, L Fesquet - Microelectronics Journal, 2018 - Elsevier
Today's integrated circuits are liable to operate under transient faults created either by
radiation or malicious sources of perturbation. Among the many techniques for the detection …

A secure exception mode for fault-attack-resistant processing

B Yuce, C Deshpande, M Ghodrati… - … on Dependable and …, 2018 - ieeexplore.ieee.org
Fault attacks are a known threat to secure embedded implementations. We propose a
generic technique to detect and react to fault attacks on embedded software. The …

Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity

RP Bastos, JM Dutertre… - 2014 5th European …, 2014 - ieeexplore.ieee.org
Several architectures of Bulk Built-In Current Sensors (BBICS) were recently proposed to
monitor transient faults induced on integrated circuits by radiation or malicious sources. This …