Si diffusion induced adhesion and corrosion resistance in annealed RF sputtered SiC films on graphite substrate
Silicon carbide (SiC) is one of the promising candidates for graphite protection in different
applications involving high temperatures and a highly corrosive environment. An ideal …
applications involving high temperatures and a highly corrosive environment. An ideal …
The effects of 167 MeV Xe26+ swift heavy ions irradiation on chemical vapour deposited silicon carbide
The microstructural changes caused by Xe 26+ swift heavy ions on polycrystalline SiC were
investigated. Chemically vapour deposited SiC samples were irradiated by 167 MeV Xe 26+ …
investigated. Chemically vapour deposited SiC samples were irradiated by 167 MeV Xe 26+ …
Surface roughness effect on the electrical characteristics of Pd/SiC nanocontacts
We report on the effect of the surface roughness of Pd nanostructures on the electrical
characteristics (Schottky barrier height) of Pd nanostructures/SiC nano-contacts as probed …
characteristics (Schottky barrier height) of Pd nanostructures/SiC nano-contacts as probed …
Dewetted Pt nanostructures on silicon carbide surface
We exploit the thermal-induced dewetting process of a deposited Pt film to produce two-
dimensional arrays of Pt nanostructures on SiC surface. After depositing 7.5 nm-thick Pt film …
dimensional arrays of Pt nanostructures on SiC surface. After depositing 7.5 nm-thick Pt film …
Morphology Evolution of Nanoscale-Thick Au/Pd Bimetallic Films on Silicon Carbide Substrate
Bimetallic Au/Pd nanoscale-thick films were sputter-deposited at room temperature on a
silicon carbide (SiC) surface, and the surface-morphology evolution of the films versus …
silicon carbide (SiC) surface, and the surface-morphology evolution of the films versus …
Investigating the structural changes induced by SHI on W–SiC samples
The structural modification of tungsten-SiC samples irradiated with Xe 26+ swift heavy ions
(SHIs) was investigated. Tungsten (W) thin films were deposited on 6H–SiC using e-beam …
(SHIs) was investigated. Tungsten (W) thin films were deposited on 6H–SiC using e-beam …