Si diffusion induced adhesion and corrosion resistance in annealed RF sputtered SiC films on graphite substrate

N Ahmed, ZS Khan, A Ashraf, H Pervaiz… - Ceramics …, 2022 - Elsevier
Silicon carbide (SiC) is one of the promising candidates for graphite protection in different
applications involving high temperatures and a highly corrosive environment. An ideal …

The effects of 167 MeV Xe26+ swift heavy ions irradiation on chemical vapour deposited silicon carbide

TT Thabethe, SA Adeojo, MN Mirzayev… - Nuclear Instruments and …, 2022 - Elsevier
The microstructural changes caused by Xe 26+ swift heavy ions on polycrystalline SiC were
investigated. Chemically vapour deposited SiC samples were irradiated by 167 MeV Xe 26+ …

Surface roughness effect on the electrical characteristics of Pd/SiC nanocontacts

F Ruffino, M Censabella, G Piccitto, MG Grimaldi - Applied Surface Science, 2020 - Elsevier
We report on the effect of the surface roughness of Pd nanostructures on the electrical
characteristics (Schottky barrier height) of Pd nanostructures/SiC nano-contacts as probed …

Dewetted Pt nanostructures on silicon carbide surface

F Ruffino, M Censabella, MG Grimaldi - Journal of Physics and Chemistry of …, 2020 - Elsevier
We exploit the thermal-induced dewetting process of a deposited Pt film to produce two-
dimensional arrays of Pt nanostructures on SiC surface. After depositing 7.5 nm-thick Pt film …

Morphology Evolution of Nanoscale-Thick Au/Pd Bimetallic Films on Silicon Carbide Substrate

F Ruffino, M Censabella, G Piccitto, MG Grimaldi - Micromachines, 2020 - mdpi.com
Bimetallic Au/Pd nanoscale-thick films were sputter-deposited at room temperature on a
silicon carbide (SiC) surface, and the surface-morphology evolution of the films versus …

Investigating the structural changes induced by SHI on W–SiC samples

TT Thabethe, TP Ntsoane, S Biira, EG Njoroge… - Vacuum, 2020 - Elsevier
The structural modification of tungsten-SiC samples irradiated with Xe 26+ swift heavy ions
(SHIs) was investigated. Tungsten (W) thin films were deposited on 6H–SiC using e-beam …