[HTML][HTML] Adhesively bonded joints–a review on design, manufacturing, experiments, modeling and challenges

Y Wei, X **, Q Luo, Q Li, G Sun - Composites Part B: Engineering, 2024 - Elsevier
This paper provides a state-of-the-art review on adhesively bonded joints (ABJs) for
composite materials and structures, with a focus on the open literatures from 2016 to 2023 to …

A SSTDR methodology, implementations, and challenges

S Kingston, E Benoit, AS Edun, F Elyasichamazkoti… - Sensors, 2021 - mdpi.com
Sequence time-domain reflectometry (STDR) and spread spectrum time-domain
reflectometry (SSTDR) detect, locate, and diagnose faults in live (energized) electrical …

Bond wire damage detection and SOH estimation of a dual-pack IGBT power module using active power cycling and reflectometry

A Hanif, D DeVoto, F Khan - IEEE Transactions on Power …, 2019 - ieeexplore.ieee.org
High thermal and electrical stress, over a period of time tends to deteriorate the health of
power electronic switches. Being a key element in any high-power converter systems, power …

Aging detection and state of health estimation of live power semiconductor devices using SSTDR embedded PWM sequence

S Roy, A Hanif, F Khan - IEEE Transactions on Power …, 2020 - ieeexplore.ieee.org
Power semiconductor switches undergo degradation due to environmental and electro-
thermal stresses resulting in an impedance variation within the device. This impedance …

Online detection of aircraft ARINC bus cable fault based on SSTDR

X Shi, Y Liu, X Xu, T **g - IEEE Systems Journal, 2020 - ieeexplore.ieee.org
In order to realize the online detection of ARINC bus cable fault, a method of spread
spectrum time-domain reflectometry (SSTDR) is proposed in this article, which can minimize …

Aging and sintered layer defect detection of discrete MOSFETs using frequency domain reflectometry associated with parasitic resistance

M Yun, D Yang, M Cai, H Yan, J Yu… - … on Device and …, 2024 - ieeexplore.ieee.org
Metal-oxide-semiconductor field-effect transistors (MOSFETs) undergo fatigue degradation
under high thermal and electrical stresses. This process results in changes in their parasitic …

Active power cycling and condition monitoring of IGBT power modules using reflectometry

A Hanif, S Das, F Khan - 2018 IEEE Applied Power Electronics …, 2018 - ieeexplore.ieee.org
High thermal and electrical stress, over a period of time tends to deteriorate the health of
power electronic switches. Being a key element in any high-power converter systems, power …

Detection of bond wire lift off in IGBT power modules using ultrasound resonators

A Hanif, ANMW Azad, F Khan - 2020 IEEE Applied Power …, 2020 - ieeexplore.ieee.org
IGBT modules are one of the key elements in power converters. When electrical stress and
environmental factors such as temperature, humidity, vibration, and so on are subjected to …

Classification of different types of faults in a photovoltaic system

R Ghosh, S Das, CK Panizrahi - 2018 International Conference …, 2018 - ieeexplore.ieee.org
Over the past several years, the rapid growth of solar industry has expanded the need of
photovoltaic systems (PV). Fault analysis in solar PV arrays is necessary because it helps to …

Live condition monitoring of switching devices using SSTDR embedded PWM sequence: A platform for intelligent gate-driver architecture

S Roy, F Khan - 2017 IEEE Energy Conversion Congress and …, 2017 - ieeexplore.ieee.org
In this paper, Spread Spectrum Time Domain Reflectometry (SSTDR) has been
implemented for the first time across the gate and the source of a power metal oxide …