Hardware trust and assurance through reverse engineering: A tutorial and outlook from image analysis and machine learning perspectives

UJ Botero, R Wilson, H Lu, MT Rahman… - ACM Journal on …, 2021 - dl.acm.org
In the context of hardware trust and assurance, reverse engineering has been often
considered as an illegal action. Generally speaking, reverse engineering aims to retrieve …

Hardware trust and assurance through reverse engineering: A survey and outlook from image analysis and machine learning perspectives

UJ Botero, R Wilson, H Lu, MT Rahman… - arxiv preprint arxiv …, 2020 - arxiv.org
In the context of hardware trust and assurance, reverse engineering has been often
considered as an illegal action. Generally speaking, reverse engineering aims to retrieve …

Refics: A step towards linking vision with hardware assurance

R Wilson, H Lu, M Zhu, D Forte… - Proceedings of the …, 2022 - openaccess.thecvf.com
Hardware assurance is a key process in ensuring the integrity, security and functionality of a
hardware device. Its heavy reliance on images, especially on Scanning Electron Microscopy …

Refics: Assimilating data-driven paradigms into reverse engineering and hardware assurance on integrated circuits

R Wilson, H Lu, M Zhu, D Forte, DL Woodard - IEEE Access, 2021 - ieeexplore.ieee.org
Comprehensive hardware assurance approaches guaranteeing trust on Integrated Circuits
(ICs) typically require the verification of the IC design layout and functionality through …

Single Image Signal-to-Noise Ratio (SNR) Estimation Techniques for Scanning Electron Microscope–A Review

DCY Ong, KS Sim - IEEE Access, 2024 - ieeexplore.ieee.org
Noises are commonly present in grayscale images, particularly in Scanning Electron
Microscope (SEM) images especially secondary emission noise, which can significantly …

Scanning electron microscope image signal‐to‐noise ratio monitoring for micro‐nanomanipulation

N Marturi, S Dembélé, N Piat - Scanning: The Journal of …, 2014 - Wiley Online Library
As an imaging system, scanning electron microscope (SEM) performs an important role in
autonomous micro‐nanomanipulation applications. When it comes to the sub micrometer …

Vision and visual servoing for nanomanipulation and nanocharacterization in scanning electron microscope.

N Marturi - 2013 - theses.hal.science
With the latest advances in nanotechnology, it became possible to design novel nanoscale
devices and systems with increasing e ciency. The consequence of this fact is an increase in …

Adaptive noise Wiener filter for scanning electron microscope imaging system

KS Sim, V Teh, ME Nia - Scanning, 2016 - Wiley Online Library
Noise on scanning electron microscope (SEM) images is studied. Gaussian noise is the
most common type of noise in SEM image. We developed a new noise reduction filter based …

Noise variance estimation using image noise cross‐correlation model on SEM images

KS Sim, ME Nia, CP Tso - Scanning, 2013 - Wiley Online Library
A number of techniques have been proposed during the last three decades for noise
variance and signal‐to‐noise ratio (SNR) estimation in digital images. While some methods …

[PDF][PDF] Hardware trust and assurance through reverse engineering

UJ Botero, R Wilson, H Lu, MT Rahman… - … Machinery: New York …, 2020 - researchgate.net
Hardware Trust and Assurance through Reverse Engineering: XXX: 3 unique patterns seen
in images of surface vertical interconnect access (via) as fingerprints of design to overcome …