Materials for high-temperature digital electronics

DK Pradhan, DC Moore, AM Francis… - Nature Reviews …, 2024 - nature.com
Silicon microelectronics, consisting of complementary metal–oxide–semiconductor
technology, have changed nearly all aspects of human life from communication to …

Reliability of NAND flash memories: Planar cells and emerging issues in 3D devices

AS Spinelli, C Monzio Compagnoni, AL Lacaita - Computers, 2017 - mdpi.com
We review the state-of-the-art in the understanding of planar NAND Flash memory reliability
and discuss how the recent move to three-dimensional (3D) devices has affected this field …

IOCost: block IO control for containers in datacenters

T Heo, D Schatzberg, A Newell, S Liu… - Proceedings of the 27th …, 2022 - dl.acm.org
Resource isolation is a fundamental requirement in datacenter environments. However, our
production experience in Meta's large-scale datacenters shows that existing IO control …

Curing of aged gate dielectric by the self-heating effect in MOSFETs

JY Park, DI Moon, GB Lee… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Gate dielectric damage caused by both internal and external stresses is becoming worse
because of aggressive complementary metal–oxide–semiconductor (CMOS) scaling …

Rethink the design of flash translation layers in a component-based view

CH Wu, DY Wu, HM Chou, CA Cheng - IEEE Access, 2017 - ieeexplore.ieee.org
NAND flash memory is a popular memory device that has many advantages such as high-
density, lightweight, shock-resistance, non-volatile, and low-power features. Although NAND …

ApproxFTL: On the performance and lifetime improvement of 3-D NAND flash-based SSDs

J Cui, Y Zhang, L Shi, CJ Xue, W Wu… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
3-D NAND flash is one of the most prospective advances in flash memory industry. While 3-
D flash improves cell density and reduces lithography cost through die stacking, it suffers …

P-Alloc: Process-variation tolerant reliability management for 3D charge-trap** flash memory

Y Wang, L Dong, R Mao - ACM Transactions on Embedded Computing …, 2017 - dl.acm.org
Three-dimensional (3D) flash memory is an emerging memory technology that enables a
number of improvements to conventional planar NAND flash memory, including larger …

NV-Dedup: High-performance inline deduplication for non-volatile memory

C Wang, Q Wei, J Yang, C Chen… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
The byte-addressable non-volatile memory (NVM) is a promising medium for data storage.
NVM-oriented file systems have been designed to explore NVM's performance potential …

DLV: Exploiting device level latency variations for performance improvement on flash memory storage systems

J Cui, Y Zhang, W Wu, J Yang, Y Wang… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
NAND flash has been widely adopted in storage systems due to its better read and write
performance and lower power consumption over traditional mechanical hard drives. To meet …

A block-level log-block management scheme for MLC NAND flash memory storage systems

Y Guan, G Wang, C Ma, R Chen… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
NAND flash memory is the major storage media for both mobile storage cards and
enterprise Solid-State Drives (SSDs). Log-block-based Flash Translation Layer (FTL) …