Multiscale analyses and characterizations of surface topographies

CA Brown, HN Hansen, XJ Jiang, F Blateyron… - CIRP annals, 2018 - Elsevier
This work studies multiscale analyses and characterizations of surface topographies from
the engineering and scientific literature with an emphasis on production engineering …

Micromorphology characterization of copper thin films by AFM and fractal analysis

A Arman, Ş Ţălu, C Luna, A Ahmadpourian… - Journal of Materials …, 2015 - Springer
In this study, Cu thin films with layer thicknesses of 5, 25, and 50 nm were prepared by DC
magnetron-sputtering method and their three dimensional (3-D) surface topography were …

Advanced fractal analysis of nanoscale topography of Ag/DLC composite synthesized by RF-PECVD

Ş Ţălu, S Abdolghaderi, EP Pinto… - Surface …, 2020 - journals.sagepub.com
We present an advanced image analysis study of the 3D surfaces of silver/diamond-like
carbon nanocomposite films prepared by radio-frequency plasma-enhanced chemical …
GQ Ramos, I da Costa Melo, RS Matos, EP Pinto… - Flora, 2023 - Elsevier
Abstract We employed Scanning Electron Microscopy (SEM) to investigate the monofractal
and multifractal characteristics of the leaf architecture of Amazon Piper krukoffii Yunck plant …