Extreme ultraviolet microscopy and wavefront sensing are key elements for next-generation
ultrafast applications, such as chemically-resolved imaging, focal spot diagnostics in pump …

Next-generation nano-and quantum devices have increasingly complex 3D structure. As the
dimensions of these devices shrink to the nanoscale, their performance is often governed by …

We demonstrate the first (to our knowledge) general purpose full-field reflection-mode
extreme ultraviolet (EUV) microscope based on coherent diffractive imaging. This …

Directly observing atomic motions in molecules during chemical dynamics has long
constituted one of the grand challenges in chemistry. 1 The emergence of X-ray free …

Scanning electron microscopy and atomic force microscopy are well-established techniques
for imaging surfaces with nanometer resolution. Here we demonstrate a complementary and …

Due to the diffraction limited resolution and the presence of speckle noise, visible laser light
is generally thought to be impractical for finding deep subwavelength defects in patterned …

We report a proof-of-principle demonstration of a new scheme of spectromicroscopy in the
extreme ultraviolet (EUV) spectral range, where the spectral response of the sample at …

Modern laser-based XUV light sources provide very high photon fluxes which have
previously only been available at large scale facilities. This allows high-performance XUV …

We demonstrate quantitative, chemically specific imaging of buried nanostructures,
including oxidation and diffusion reactions at buried interfaces, using nondestructive …

Imaging charge, spin, and energy flow in materials is a current grand challenge that is
relevant to a host of nanoenhanced systems, including thermoelectric, photovoltaic …