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3-D integration and through-silicon vias in MEMS and microsensors
Z Wang - Journal of Microelectromechanical Systems, 2015 - ieeexplore.ieee.org
After two decades of intensive development, 3-D integration has proven invaluable for
allowing integrated circuits to adhere to Moore's Law without needing to continuously shrink …
allowing integrated circuits to adhere to Moore's Law without needing to continuously shrink …
[HTML][HTML] Advanced 3D Through-Si-Via and Solder Bum** Technology: A Review
YJ Jang, A Sharma, JP Jung - Materials, 2023 - mdpi.com
Three-dimensional (3D) packaging using through-Si-via (TSV) is a key technique for
achieving high-density integration, high-speed connectivity, and for downsizing of electronic …
achieving high-density integration, high-speed connectivity, and for downsizing of electronic …
Microsystems using three-dimensional integration and TSV technologies: Fundamentals and applications
Z Wang - Microelectronic Engineering, 2019 - Elsevier
As a powerful enabling technology, three-dimensional (3D) integration, which uses wafer
bonding to integrate multiple wafers in the vertical direction and uses through‑silicon-vias …
bonding to integrate multiple wafers in the vertical direction and uses through‑silicon-vias …
Alternative insulation liners for through-silicon vias: A comprehensive review
In contemporary times, 3D integration is acknowledged as the most promising direction for
the development of the chip industry. The core technology behind 3D integration is through …
the development of the chip industry. The core technology behind 3D integration is through …
Low capacitance through-silicon-vias with uniform benzocyclobutene insulation layers
Low capacitance is critical to the electric performance of through-silicon-vias (TSVs). This
paper reports the development of a low capacitance TSVs by replacing silicon dioxide …
paper reports the development of a low capacitance TSVs by replacing silicon dioxide …
3D stacked microfluidic cooling for high-performance 3D ICs
Cooling is a significant challenge for high-performance high-power 3D ICs. hi this paper, we
describe the experimental evaluation of 3D ICs with embedded microfluidic cooling …
describe the experimental evaluation of 3D ICs with embedded microfluidic cooling …
Very high aspect ratio through-silicon vias (TSVs) fabricated using automated magnetic assembly of nickel wires
Through-silicon via (TSV) technology enables 3D-integrated devices with higher
performance and lower cost as compared to 2D-integrated systems. This is mainly due to …
performance and lower cost as compared to 2D-integrated systems. This is mainly due to …
High aspect ratio and low capacitance through-silicon-vias (TSVs) with polymer insulation layers
Polymer insulation layers (liners) have several potential advantages in terms of capacitance
and reliability over conventional silicon dioxide for through-silicon-via (TSV) applications …
and reliability over conventional silicon dioxide for through-silicon-via (TSV) applications …
Tape-assisted transfer of carbon nanotube bundles for through-silicon-via applications
Robust methods for transferring vertically aligned carbon nanotube (CNT) bundles into
through-silicon vias (TSVs) are needed since CNT growth is not compatible with …
through-silicon vias (TSVs) are needed since CNT growth is not compatible with …
[HTML][HTML] A new approach for the control and reduction of warpage and residual stresses in bonded wafer
A geometrical modification on silicon wafers before the bonding process, aimed to decrease
(1) the residual stress caused by glass frit bonding, is proposed. Finite element modeling …
(1) the residual stress caused by glass frit bonding, is proposed. Finite element modeling …