3-D integration and through-silicon vias in MEMS and microsensors

Z Wang - Journal of Microelectromechanical Systems, 2015 - ieeexplore.ieee.org
After two decades of intensive development, 3-D integration has proven invaluable for
allowing integrated circuits to adhere to Moore's Law without needing to continuously shrink …

[HTML][HTML] Advanced 3D Through-Si-Via and Solder Bum** Technology: A Review

YJ Jang, A Sharma, JP Jung - Materials, 2023 - mdpi.com
Three-dimensional (3D) packaging using through-Si-via (TSV) is a key technique for
achieving high-density integration, high-speed connectivity, and for downsizing of electronic …

Microsystems using three-dimensional integration and TSV technologies: Fundamentals and applications

Z Wang - Microelectronic Engineering, 2019 - Elsevier
As a powerful enabling technology, three-dimensional (3D) integration, which uses wafer
bonding to integrate multiple wafers in the vertical direction and uses through‑silicon-vias …

Alternative insulation liners for through-silicon vias: A comprehensive review

M Tian, X Gu - Materials Science in Semiconductor Processing, 2023 - Elsevier
In contemporary times, 3D integration is acknowledged as the most promising direction for
the development of the chip industry. The core technology behind 3D integration is through …

Low capacitance through-silicon-vias with uniform benzocyclobutene insulation layers

Q Chen, C Huang, Z Tan, Z Wang - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
Low capacitance is critical to the electric performance of through-silicon-vias (TSVs). This
paper reports the development of a low capacitance TSVs by replacing silicon dioxide …

3D stacked microfluidic cooling for high-performance 3D ICs

Y Zhang, A Dembla, Y Joshi… - 2012 IEEE 62nd …, 2012 - ieeexplore.ieee.org
Cooling is a significant challenge for high-performance high-power 3D ICs. hi this paper, we
describe the experimental evaluation of 3D ICs with embedded microfluidic cooling …

Very high aspect ratio through-silicon vias (TSVs) fabricated using automated magnetic assembly of nickel wires

AC Fischer, SJ Bleiker, T Haraldsson… - Journal of …, 2012 - iopscience.iop.org
Through-silicon via (TSV) technology enables 3D-integrated devices with higher
performance and lower cost as compared to 2D-integrated systems. This is mainly due to …

High aspect ratio and low capacitance through-silicon-vias (TSVs) with polymer insulation layers

C Huang, Q Chen, D Wu, Z Wang - Microelectronic Engineering, 2013 - Elsevier
Polymer insulation layers (liners) have several potential advantages in terms of capacitance
and reliability over conventional silicon dioxide for through-silicon-via (TSV) applications …

Tape-assisted transfer of carbon nanotube bundles for through-silicon-via applications

W Mu, S Sun, D Jiang, Y Fu, M Edwards… - Journal of Electronic …, 2015 - Springer
Robust methods for transferring vertically aligned carbon nanotube (CNT) bundles into
through-silicon vias (TSVs) are needed since CNT growth is not compatible with …

[HTML][HTML] A new approach for the control and reduction of warpage and residual stresses in bonded wafer

SAF Farshchi Yazdi, M Garavaglia, A Ghisi… - Micromachines, 2021 - mdpi.com
A geometrical modification on silicon wafers before the bonding process, aimed to decrease
(1) the residual stress caused by glass frit bonding, is proposed. Finite element modeling …